Experimental observation of bulk band dispersions in the oxide semiconductor ZnO using soft x-ray angle-resolved photoemission spectroscopy

2009 ◽  
Vol 105 (12) ◽  
pp. 122403 ◽  
Author(s):  
M. Kobayashi ◽  
G. S. Song ◽  
T. Kataoka ◽  
Y. Sakamoto ◽  
A. Fujimori ◽  
...  
Keyword(s):  
Experimental Observation ◽  
Oxide Semiconductor ◽  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy ◽  
Bulk Band

Observation of bulk band dispersions of YbRh2Si2using soft x-ray angle-resolved photoemission spectroscopy

2013 ◽  
Vol 87 (7) ◽  
Author(s):  
A. Yasui ◽  
Y. Saitoh ◽  
S.-i. Fujimori ◽  
I. Kawasaki ◽  
T. Okane ◽  
...  
Keyword(s):  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy ◽  
Bulk Band

Aging of the surface of an Al-Cr-Fe approximant phase in ambient conditions: chemical composition and physical properties

2003 ◽  
Vol 805 ◽  
Author(s):  
D. Veys ◽  
P. Weisbecker ◽  
V. Fournée ◽  
B. Domenichini ◽  
S. Weber ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Mass Spectroscopy ◽  
Electrochemical Behavior ◽  
Stable State ◽  
Photoemission Spectroscopy ◽  
Atmospheric Conditions ◽  
Electrical Model ◽  
Ambient Conditions ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy

ABSTRACTWe have investigated the surface properties of quasicrystalline and approximant phases in the Al-(Cu)-Cr-Fe system upon aging in ambient conditions. We found that some of these properties (like the electrochemical behavior, wetting or friction) slowly evolves with the length of exposure to normal atmospheric conditions, reaching a stable state only after several days. This report essentially focuses on one of these alloys, an Al65Cr27Fe8 approximant phase with g-brass structure. In a first part, we describe the effect of aging on the electrochemical behavior of this alloy and we propose an interpretation based on a simple electrical model of the oxidized surface. In a second part, we present a model describing the surface as a stacking of several layers (oxides, oxy-hydroxides, contamination) whose thickness evolves with time. The model is supported by X-ray reflectivity, angle-resolved photoemission spectroscopy and secondary neutral mass spectroscopy measurements.

scholarly journals Itinerant U5fband states in the layered compoundUFeGa5observed by soft x-ray angle-resolved photoemission spectroscopy

2006 ◽  
Vol 73 (12) ◽  
Author(s):  
Shin-ichi Fujimori ◽  
Kota Terai ◽  
Yukiharu Takeda ◽  
Tetsuo Okane ◽  
Yuji Saitoh ◽  
...  
Keyword(s):  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy

Electronic Structure of Trivalent Compound EuPd3 Studied by Soft X-ray Angle-resolved Photoemission Spectroscopy

2020 ◽  
Vol 89 (4) ◽  
pp. 044704 ◽  
Author(s):  
Ikuto Kawasaki ◽  
Masaaki Kobata ◽  
Shin-ichi Fujimori ◽  
Yukiharu Takeda ◽  
Hiroshi Yamagami ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy

scholarly journals Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals

2011 ◽  
Vol 18 (6) ◽  
pp. 879-884 ◽  
Author(s):  
Takayuki Muro ◽  
Yukako Kato ◽  
Tomohiro Matsushita ◽  
Toyohiko Kinoshita ◽  
Yoshio Watanabe ◽  
...  
Keyword(s):  
Electronic States ◽  
Spot Size ◽  
Optical Microscope ◽  
Photoemission Spectroscopy ◽  
Beam Spot ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy ◽  
Clear Band ◽  
Sample Position

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleavedin situwith a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ–Xdirection reflecting the bulk electronic states were observed with a photon energy of 879 eV.

scholarly journals Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films

2006 ◽  
Vol 7 (sup1) ◽  
pp. S12-S16 ◽  
Author(s):  
T. Yokoya ◽  
T. Nakamura ◽  
T. Matushit ◽  
T. Muro ◽  
H. Okazaki ◽  
...  
Keyword(s):  
Diamond Films ◽  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy ◽  
Boron Doped

Band structure and Fermi surface of UPd3studied by soft x-ray angle-resolved photoemission spectroscopy

2013 ◽  
Vol 87 (7) ◽  
Author(s):  
Ikuto Kawasaki ◽  
Shin-ichi Fujimori ◽  
Yukiharu Takeda ◽  
Tetsuo Okane ◽  
Akira Yasui ◽  
...  
Keyword(s):  
Band Structure ◽  
Fermi Surface ◽  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy

Bulk Sensitive Soft X-ray Angle-Resolved Photoemission Spectroscopy of Bi1.72Pb0.38Sr1.88CuO6+δ

2010 ◽  
Vol 79 (6) ◽  
pp. 064711
Author(s):  
Tsunehiro Takeuchi ◽  
Yoichiro Hamaya ◽  
Hiroshi Ikuta ◽  
Takuo Ohkochi ◽  
Shin-ichi Fujimori ◽  
...  
Keyword(s):  
Photoemission Spectroscopy ◽  
X Ray ◽  
Angle Resolved Photoemission Spectroscopy
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