SIMS∕ARXPS—A New Technique of Retained Dopant Dose and Profile Measurement of Low Energy Doping Processes

2008 ◽  
Author(s):  
Shu Qin ◽  
Kent Zhuang ◽  
Shifeng Lu ◽  
Allen McTeer ◽  
Wendy Morinville ◽  
...  
Keyword(s):  
Low Energy ◽  
New Technique ◽  
Profile Measurement ◽  
A New Technique

Absolute cross sections for multielectron processes in low-energy Arq+-Ar collisions as measured with a new technique

1984 ◽  
Vol 17 (24) ◽  
pp. L877-L883 ◽  
Author(s):  
G Astner ◽  
A Barany ◽  
H Cederquist ◽  
H Danared ◽  
S Huldt ◽  
...  
Keyword(s):  
Cross Sections ◽  
Low Energy ◽  
New Technique ◽  
A New Technique

A new technique for measuring weak neutron scattering in low energy resonances

1967 ◽  
Vol 52 (2) ◽  
pp. 321-324 ◽  
Author(s):  
T.J. King ◽  
R.R. Fullwood ◽  
R.C. Block
Keyword(s):  
Neutron Scattering ◽  
Low Energy ◽  
New Technique ◽  
A New Technique
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