Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array

2008 ◽  
Vol 93 (23) ◽  
pp. 231103 ◽  
Author(s):  
B. Mills ◽  
C. F. Chau ◽  
E. T. F. Rogers ◽  
J. Grant-Jacob ◽  
S. L. Stebbings ◽  
...  
Keyword(s):  
Refractive Index ◽  
Direct Measurement ◽  
Spectral Region ◽  
Extreme Ultraviolet ◽  
Complex Refractive Index ◽  
Ultraviolet Spectral Region

scholarly journals Complex refractive indices in the near-ultraviolet spectral region of biogenic secondary organic aerosol aged with ammonia

2014 ◽  
Vol 16 (22) ◽  
pp. 10629-10642 ◽  
Author(s):  
J. M. Flores ◽  
R. A. Washenfelder ◽  
G. Adler ◽  
H. J. Lee ◽  
L. Segev ◽  
...  
Keyword(s):  
Refractive Index ◽  
Spectral Region ◽  
Secondary Organic Aerosol ◽  
Complex Refractive Index ◽  
Organic Aerosol ◽  
Refractive Indices ◽  
Near Ultraviolet ◽  
Ultraviolet Spectral Region ◽  
P Distribution

Distribution of the number of N atoms and the change in the complex refractive index of unreacted and NH3-aged limonene SOA.

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

New test facility for reflectivity measurements in the extreme- ultraviolet spectral region

1993 ◽  
Author(s):  
Paolo Villoresi ◽  
Giampiero Naletto ◽  
Piergiorgio Nicolosi ◽  
Giuseppe Tondello ◽  
Ermanno Jannitti
Keyword(s):  
Spectral Region ◽  
Extreme Ultraviolet ◽  
Test Facility ◽  
Ultraviolet Spectral Region

Thin film and multilayer coating development for the extreme ultraviolet spectral region

2006 ◽  
Vol 75 (11) ◽  
pp. 1966-1971 ◽  
Author(s):  
D. Garoli ◽  
G. Monaco ◽  
F. Frassetto ◽  
M.G. Pelizzo ◽  
P. Nicolosi ◽  
...  
Keyword(s):  
Thin Film ◽  
Spectral Region ◽  
Extreme Ultraviolet ◽  
Multilayer Coating ◽  
Ultraviolet Spectral Region

scholarly journals Coherent control schemes for the photoionization of neon and helium in the Extreme Ultraviolet spectral region

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Luca Giannessi ◽  
Enrico Allaria ◽  
Kevin C. Prince ◽  
Carlo Callegari ◽  
Giuseppe Sansone ◽  
...  
Keyword(s):  
Spectral Region ◽  
Coherent Control ◽  
Extreme Ultraviolet ◽  
Control Schemes ◽  
Ultraviolet Spectral Region
Sign in / Sign up

Export Citation Format

Share Document