scholarly journals Relaxation time effects on dynamic conductivity of alloyed metallic thin films in the infrared band

2008 ◽  
Vol 104 (10) ◽  
pp. 103514 ◽  
Author(s):  
D. J. Shelton ◽  
T. Sun ◽  
J. C. Ginn ◽  
K. R. Coffey ◽  
G. D. Boreman
Keyword(s):  
Thin Films ◽  
Relaxation Time ◽  
Metallic Thin Films ◽  
Infrared Band ◽  
Time Effects ◽  
Dynamic Conductivity

Rocking Beam Microarea Diffraction Applied to Metallic thin Films

1976 ◽  
Vol 34 ◽  
pp. 396-397
Author(s):  
R. H. Geiss
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Small Area ◽  
Objective Lens ◽  
Electron Optics ◽  
Metallic Thin Films ◽  
Transmission Electron Diffraction ◽  
Transmission Electron ◽  
Sample Height ◽  
Scanning Transmission

The theory and practical limitations of micro area scanning transmission electron diffraction (MASTED) will be presented. It has been demonstrated that MASTED patterns of metallic thin films from areas as small as 30 Åin diameter may be obtained with the standard STEM unit available for the Philips 301 TEM. The key to the successful application of MASTED to very small area diffraction is the proper use of the electron optics of the STEM unit. First the objective lens current must be adjusted such that the image of the C2 aperture is quasi-stationary under the action of the rocking beam (obtained with 40-80-160 SEM settings of the P301). Second, the sample must be elevated to coincide with the C2 aperture image and its image also be quasi-stationary. This sample height adjustment must be entirely mechanical after the objective lens current has been fixed in the first step.

Phase sequence in the solid state amorphization reaction of metallic thin films

1989 ◽  
Vol 174 ◽  
pp. 11-24 ◽  
Author(s):  
S. Schneider ◽  
H. Schröder ◽  
K. Samwer ◽  
B. Schuhmacher ◽  
U. Köster
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Metallic Thin Films ◽  
Phase Sequence ◽  
State Amorphization

Analysis of damage formation and propagation in metallic thin films under the action of thermal stresses and electric fields

1996 ◽  
Vol 2 (3) ◽  
pp. 231-258 ◽  
Author(s):  
Dimitrios Maroudas ◽  
Matthew N. Enmark ◽  
Cora M. Leibig ◽  
Sokrates T. Pantelides
Keyword(s):  
Thin Films ◽  
Electric Fields ◽  
Thermal Stresses ◽  
Metallic Thin Films

Sulfurization time effects on the growth of Cu2ZnSnS4 thin films by solution method

2013 ◽  
Vol 24 (8) ◽  
pp. 2667-2671 ◽  
Author(s):  
Hao Guan ◽  
Honglie Shen ◽  
Chao Gao ◽  
Xiancong He
Keyword(s):  
Thin Films ◽  
Solution Method ◽  
Time Effects ◽  
Sulfurization Time
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