Subwavelength imaging based on frequency scanning

2008 ◽  
Vol 104 (10) ◽  
pp. 103109 ◽  
Author(s):  
Stanislav Maslovski ◽  
Pekka Alitalo ◽  
Sergei Tretyakov
Keyword(s):  
Subwavelength Imaging ◽  
Frequency Scanning

Acoustic microscopy techniques for the inspection of integrated circuit devices and packages

1992 ◽  
Vol 50 (2) ◽  
pp. 966-967
Author(s):  
Thomas M. Moore
Keyword(s):  
Integrated Circuit ◽  
Acoustic Microscopy ◽  
Hybrid Technique ◽  
Frequency Scanning ◽  
Ic Packaging ◽  
Ic Package ◽  
Microscopy Techniques ◽  
Ic Package Inspection ◽  
Pulse Echo ◽  
Scanning Acoustic Microscope

In the last decade, a variety of characterization techniques based on acoustic phenomena have come into widespread use. Characteristics of matter waves such as their ability to penetrate optically opaque solids and produce image contrast based on acoustic impedance differences have made these techniques attractive to semiconductor and integrated circuit (IC) packaging researchers.These techniques can be divided into two groups. The first group includes techniques primarily applied to IC package inspection which take advantage of the ability of ultrasound to penetrate deeply and nondestructively through optically opaque solids. C-mode Acoustic Microscopy (C-AM) is a recently developed hybrid technique which combines the narrow-band pulse-echo piezotransducers of conventional C-scan recording with the precision scanning and sophisticated signal analysis capabilities normally associated with the high frequency Scanning Acoustic Microscope (SAM). A single piezotransducer is scanned over the sample and both transmits acoustic pulses into the sample and receives acoustic echo signals from the sample.

Subwavelength Imaging

2008 ◽  
Author(s):  
Kevin J. Webb ◽  
Huikan Liu ◽  
Alon Ludwig ◽  
S. Schivanand
Keyword(s):  
Subwavelength Imaging

Carbon-nanotube field-emitter driven compact, frequency-scanning THz source

2007 ◽  
Author(s):  
S. J. Papadakis ◽  
A. H. Monica ◽  
J. Yu ◽  
J. A. Miragliotta ◽  
R. Osiander ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Field Emitter ◽  
Frequency Scanning
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