A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface

2008 ◽  
Vol 79 (10) ◽  
pp. 103701 ◽  
Author(s):  
A. Z. Stieg ◽  
H. I. Rasool ◽  
J. K. Gimzewski
Keyword(s):  
Liquid Interface ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope ◽  
Solid Liquid Interface ◽  
Solid Liquid

scholarly journals Confined Pulsed Diffuse Layer Charging for Nanoscale Electrodeposition with a Scanning Tunnelling Microscope

2022 ◽  
Author(s):  
Mark Aarts ◽  
Alain Reiser ◽  
Spolenak Ralph ◽  
Esther Alarcon-Llado
Keyword(s):  
Electric Fields ◽  
Liquid Interface ◽  
The State ◽  
Scanning Probe ◽  
Diffuse Layer ◽  
Scanning Tunnelling Microscope ◽  
Scanning Tunnelling ◽  
Solid Liquid Interface ◽  
Solid Liquid

Regulating the state of the solid-liquid interface by means of electric fields is a powerful tool to control electrochemistry. In scanning probe systems, this can be confined closely to a...

Scanning Probe Studies of Porphyrin Assemblies and Their Supramolecular Manipulation at a Solid–Liquid Interface

2003 ◽  
Vol 15 (24) ◽  
pp. 2070-2073 ◽  
Author(s):  
J.A.A.W. Elemans ◽  
M.C. Lensen ◽  
J.W. Gerritsen ◽  
H. van Kempen ◽  
S. Speller ◽  
...  
Keyword(s):  
Liquid Interface ◽  
Scanning Probe ◽  
Solid Liquid Interface ◽  
Solid Liquid

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

Observation of Femtosecond Acoustic Anomaly in a Solid Liquid Interface

2020 ◽  
Vol 124 (5) ◽  
pp. 2987-2993
Author(s):  
Chi-Kuang Sun ◽  
Yi-Ting Yao ◽  
Chih-Chiang Shen ◽  
Mu-Han Ho ◽  
Tien-Chang Lu ◽  
...  
Keyword(s):  
Liquid Interface ◽  
Acoustic Anomaly ◽  
Solid Liquid Interface ◽  
Solid Liquid
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