Room-temperature ferromagnetism in single crystal Fe1.7Ge thin films of high thermal stability grown on Ge(111)

2008 ◽  
Vol 93 (3) ◽  
pp. 033114 ◽  
Author(s):  
R. Jaafar ◽  
Y. Nehme ◽  
D. Berling ◽  
J. L. Bubendorff ◽  
A. Mehdaoui ◽  
...  
Author(s):  
Jing Wang ◽  
Weiyuan Wang ◽  
Jiyu Fan ◽  
Huan Zheng ◽  
Hao Liu ◽  
...  

Abstract Large-scale growth of two-dimensional (2D) ferromagnetic thin films will provide an ideal platform for studying 2D magnetism and active spintronic devices. However, controllable growth of 2D ferromagnets over large areas faces tremendous challenges. Herein, we report a large-area growth of 2D ferromagnetic single-crystal thin films Cr4Te5 on Al2O3 (0001) substrates using pulsed laser deposition. X-ray diffraction patterns and atomic force microscopy detection confirm that all thin films are high quality epitaxy together with atom-level smooth. Magnetic measurements show the persistence of ferromagnetic ordering state up to above room temperature, with a Curie temperature 320 K, atomic magnetic moment 0.307µB/Cr, and the easy-magnetization axis in film plane. Comparing bulk Cr4Te5 single-crystal, the critical exponent β=0.491 indicates that the magnetic interactions of thin film obey mean-field model rather than 3D Heisenberg model. This work will open a avenue for growing large-scale 2D ferromagnet and developing room temperature 2D magnet-based nanodevices.


2021 ◽  
Vol 527 ◽  
pp. 167775
Author(s):  
Xiaodong Zhou ◽  
Erlei Wang ◽  
Xiaodong Lao ◽  
Yongmei Wang ◽  
Honglei Yuan

Metals ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 31
Author(s):  
Hongxin Liao ◽  
Taekyung Lee ◽  
Jiangfeng Song ◽  
Jonghyun Kim ◽  
Fusheng Pan

The microstructures and mechanical properties of the Mg88.5Zn5Y6.5-XREX (RE = Yb and Ce, X = 0, 1.5, 3.0, and 4.5) (wt.%) alloys were investigated in the present study. Mg88.5Zn5Y6.5 is composed of three phases, namely, α-Mg, long-period stacking ordered (LPSO) phases, and intermetallic compounds. The content of the LPSO phases decreased with the addition of Ce and Yb, and no LPSO phases were detected in Mg88.5Zn5Y2.0Yb4.5. The alloys containing the LPSO phases possessed a stratified microstructure and exhibited excellent mechanical properties. Mg88.5Zn5Y5.0Ce1.5 exhibited the highest creep resistance and mechanical strength at both room temperature and 200 °C, owing to its suitable microstructure and high thermal stability. The yield strength of Mg88.5Zn5Y5.0Ce1.5 at room temperature was 358 MPa. The ultimate tensile strength of Mg88.5Zn5Y5.0Ce1.5 at room temperature and 200 °C was 453 MPa and 360 MPa, respectively.


2004 ◽  
Vol 36 (4-6) ◽  
pp. 403-408 ◽  
Author(s):  
D. O’Mahony ◽  
F. McGee ◽  
M. Venkatesan ◽  
J.G. Lunney ◽  
J.M.D. Coey

1995 ◽  
Vol 388 ◽  
Author(s):  
Yoshihisa Watanabe ◽  
Yoshikazu Nakamura ◽  
Shigekazu Hirayama ◽  
Yuusaku Naota

AbstractAluminum nitride (AlN) thin films have been synthesized by ion-beam assisted deposition method. Film deposition has been performed on the substrates of silicon single crystal, soda-lime glass and alumin A. the influence of the substrate roughness on the film roughness is studied. the substrate temperature has been kept at room temperature and 473K and the kinetic energy of the incident nitrogen ion beam and the deposition rate have been fixed to 0.5 keV and 0.07 nm/s, respectively. the microstructure of the synthesized films has been examined by X-ray diffraction (XRD) and the surface morphology has been observed by atomic force microscopy(AFM). IN the XRD patterns of films synthesized at both room temperature and 473K, the diffraction line indicating the alN (10*0) can be discerned and the broad peak composed of two lines indicating the a1N (00*2) and a1N (10*1) planes is also observed. aFM observations for 100 nm films reveal that (1) the surface of the films synthesized on the silicon single crystal and soda-lime glass substrates is uniform and smooth on the nanometer scale, (2) the average roughness of the films synthesized on the alumina substrate is similar to that of the substrate, suggesting the evaluation of the average roughness of the film itself is difficult in the case of the rough substrate, and (3) the average roughness increases with increasing the substrate temperature.


2014 ◽  
Vol 23 (10) ◽  
pp. 106101 ◽  
Author(s):  
Nan-Nan Xu ◽  
Gong-Ping Li ◽  
Xiao-Dong Pan ◽  
Yun-Bo Wang ◽  
Jing-Sheng Chen ◽  
...  

2007 ◽  
Vol 24 (1) ◽  
pp. 218-221 ◽  
Author(s):  
Song Yuan-Qiang ◽  
Zhang Huai-Wu ◽  
Wen Qi-Ye ◽  
Li Yuan-Xun ◽  
John Q Xiao

2018 ◽  
Vol 123 (16) ◽  
pp. 161507 ◽  
Author(s):  
B. Ghosh ◽  
Sekhar C. Ray ◽  
Mbule Pontsho ◽  
Sweety Sarma ◽  
Dilip K. Mishra ◽  
...  

2004 ◽  
Vol 271 (3-4) ◽  
pp. 420-424 ◽  
Author(s):  
Moon-Ho Ham ◽  
Sukho Yoon ◽  
Yongjo Park ◽  
Jae-Min Myoung

2012 ◽  
Vol 152 (17) ◽  
pp. 1625-1629 ◽  
Author(s):  
H.B. Ruan ◽  
L. Fang ◽  
G.P. Qin ◽  
T.Y. Yang ◽  
W.J. Li ◽  
...  

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