Morphological evolution of voids by surface drift diffusion driven by capillary, electromigration, and thermal-stress gradients induced by steady-state heat flow in passivated metallic thin films and flip chip solder joints. I. Theory
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2008 ◽
pp. 151-156
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1979 ◽
Vol 62
(7-8)
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pp. 431-432
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1976 ◽
Vol 2
(3)
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pp. 257-274
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1990 ◽
Vol 33
(3)
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pp. 334-341
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