scholarly journals Surface resistivity estimation by scanning surface potential microscopy

2008 ◽  
Vol 79 (6) ◽  
pp. 066101 ◽  
Author(s):  
Z. Rakocevic ◽  
N. Popovic ◽  
Z. Bogdanov ◽  
B. Goncic ◽  
S. Strbac
Keyword(s):  
Surface Potential ◽  
Surface Resistivity ◽  
Scanning Surface Potential Microscopy

Scanning Surface Potential Microscopy

2012 ◽  
pp. 2293-2293
Author(s):  
Yimei Zhu ◽  
Hiromi Inada ◽  
Achim Hartschuh ◽  
Li Shi ◽  
Ada Della Pia ◽  
...  
Keyword(s):  
Surface Potential ◽  
Scanning Surface Potential Microscopy

Electrical behavior of isolated multiwall carbon nanotubes characterized by scanning surface potential microscopy

2002 ◽  
Vol 81 (3) ◽  
pp. 541-543 ◽  
Author(s):  
S. B. Schujman ◽  
R. Vajtai ◽  
S. Biswas ◽  
B. Dewhirst ◽  
L. J. Schowalter ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Surface Potential ◽  
Multiwall Carbon Nanotubes ◽  
Electrical Behavior ◽  
Scanning Surface Potential Microscopy ◽  
Multiwall Carbon

Scanning Surface Potential Microscopy for Local Surface Analysis

1992 ◽  
Vol 21 (11) ◽  
pp. 2223-2226 ◽  
Author(s):  
Masamichi Fujihira ◽  
Hirosuke Kawate ◽  
Masatoshi Yasutake
Keyword(s):  
Surface Analysis ◽  
Surface Potential ◽  
Local Surface ◽  
Scanning Surface Potential Microscopy

Characterization of Ferroelectric BaTiO3 (100) Surfaces by Variable Temperature Scanning Surface Potential Microscopy and Piezoresponse Imaging

1999 ◽  
Vol 596 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Surface Potential ◽  
Variable Temperature ◽  
Piezoelectric Response ◽  
Ferroelectric State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Temperature Scanning ◽  
Scanning Surface Potential Microscopy ◽  
Kinetics Of

AbstractVariable temperature atomic force microscopy (AFM), scanning surface potential microscopy (SSPM) and piezoresponse imaging were applied to the characterization of a model BaTiO3(100) surface. The influence of the domain structure on surface topography, surface potential and piezoresponse image is discussed. The domain induced surface corrugations and piezoelectric response were found to disappear above the Curie temperature in full agreement with theoretical expectations. Relaxation of apparent surface potential after the transition to paraelectric state on heating and during the transition to ferroelectric state on cooling was observed. The kinetics of potential relaxation was orders of magnitude slower than that of the transition.

scholarly journals Artifacts and Non-Local Effects in SPM Potential Measurements

2002 ◽  
Vol 10 (4) ◽  
pp. 16-21
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Surface Potential ◽  
Scanning Probe Microscopy ◽  
Nanoscale Systems ◽  
First Pass ◽  
Non Local ◽  
Imaging Artifacts ◽  
Dual Pass ◽  
Scanning Surface Potential Microscopy ◽  
Physical Phenomena ◽  
Fundamental Physical

In the last few years Scanning Probe Microscopy (SPM) has become one of the primary tools of science and technology. In addition to topographical imaging, surface potential, conductivity, optical, ferroelectric and magnetic properties that can be studied down to the nanometer level. However, quantitative and sometimes qualitative studies of fundamental physical phenomena in meso- and nanoscale systems are often hindered by SPM imaging artifacts. Here we briefly discuss the principles of operation and the major sources of artifacts in electrostatic measurements by SPM.One of the most well known techniques for local potential imaging is Scanning Surface Potential Microscopy (SSPM). SSPM is based on dual pass imaging. The grounded tip acquires surface topography during the first pass.

Sign in / Sign up

Export Citation Format

Share Document