scholarly journals Erratum: “Theory of phase-modulation atomic force microscopy with constant-oscillation amplitude” [J. Appl. Phys. 103, 064317 (2008)]

2008 ◽  
Vol 103 (8) ◽  
pp. 089902
Author(s):  
Hendrik Hölscher
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
Oscillation Amplitude ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments

AIP Advances ◽  
2011 ◽  
Vol 1 (2) ◽  
pp. 022136 ◽  
Author(s):  
A. Labuda ◽  
K. Kobayashi ◽  
D. Kiracofe ◽  
K. Suzuki ◽  
P. H. Grütter ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

2012 ◽  
Vol 3 ◽  
pp. 336-344 ◽  
Author(s):  
Miriam Jaafar ◽  
David Martínez-Martín ◽  
Mariano Cuenca ◽  
John Melcher ◽  
Arvind Raman ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Frequency Modulation ◽  
Driving Force ◽  
Oscillation Amplitude ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modulation Mode ◽  
Feedback Scheme

We introduce drive-amplitude-modulation atomic force microscopy as a dynamic mode with outstanding performance in all environments from vacuum to liquids. As with frequency modulation, the new mode follows a feedback scheme with two nested loops: The first keeps the cantilever oscillation amplitude constant by regulating the driving force, and the second uses the driving force as the feedback variable for topography. Additionally, a phase-locked loop can be used as a parallel feedback allowing separation of the conservative and nonconservative interactions. We describe the basis of this mode and present some examples of its performance in three different environments. Drive-amplutide modulation is a very stable, intuitive and easy to use mode that is free of the feedback instability associated with the noncontact-to-contact transition that occurs in the frequency-modulation mode.

Multifrequency high-speed phase-modulation atomic force microscopy in liquids

2010 ◽  
Vol 110 (6) ◽  
pp. 582-585 ◽  
Author(s):  
Yan Jun Li ◽  
Kouhei Takahashi ◽  
Naritaka Kobayashi ◽  
Yoshitaka Naitoh ◽  
Masami Kageshima ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Interpreting motion and force for narrow-band intermodulation atomic force microscopy

2013 ◽  
Vol 4 ◽  
pp. 45-56 ◽  
Author(s):  
Daniel Platz ◽  
Daniel Forchheimer ◽  
Erik A Tholén ◽  
David B Haviland
Keyword(s):  
Atomic Force Microscopy ◽  
Narrow Band ◽  
Frequency Comb ◽  
Oscillation Amplitude ◽  
Surface Force ◽  
Amplitude Dependence ◽  
Band Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Components

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip–surface force that are in-phase with the tip motion (F I ) and quadrature to the motion (F Q ). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that F I and F Q actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of F I and F Q from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components F I and F Q , providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.

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