scholarly journals Synthesis and characterization of smooth ultrananocrystalline diamond films via low pressure bias-enhanced nucleation and growth

2008 ◽  
Vol 92 (13) ◽  
pp. 133113 ◽  
Author(s):  
Y. C. Chen ◽  
X. Y. Zhong ◽  
A. R. Konicek ◽  
D. S. Grierson ◽  
N. H. Tai ◽  
...  
Keyword(s):  
Diamond Films ◽  
Low Pressure ◽  
Nucleation And Growth ◽  
Synthesis And Characterization ◽  
Ultrananocrystalline Diamond

Synthesis and characterization of highly-conducting nitrogen-doped ultrananocrystalline diamond films

2001 ◽  
Vol 79 (10) ◽  
pp. 1441-1443 ◽  
Author(s):  
S. Bhattacharyya ◽  
O. Auciello ◽  
J. Birrell ◽  
J. A. Carlisle ◽  
L. A. Curtiss ◽  
...  
Keyword(s):  
Diamond Films ◽  
Synthesis And Characterization ◽  
Nitrogen Doped ◽  
Ultrananocrystalline Diamond

Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges

2010 ◽  
Vol 204 (12-13) ◽  
pp. 1997-2001 ◽  
Author(s):  
Monika Karásková ◽  
Lenka Zajíčková ◽  
Vilma Buršíková ◽  
Daniel Franta ◽  
David Nečas ◽  
...  
Keyword(s):  
Mechanical Characterization ◽  
Diamond Films ◽  
Dual Frequency ◽  
Ultrananocrystalline Diamond

Synthesis and characterization of low pressure chemically vapor deposited titanium nitride films using TiCl4 and NH3

2002 ◽  
Vol 57 (2) ◽  
pp. 261-269 ◽  
Author(s):  
N Ramanuja ◽  
R.A Levy ◽  
S.N Dharmadhikari ◽  
E Ramos ◽  
C.W Pearce ◽  
...  
Keyword(s):  
Titanium Nitride ◽  
Low Pressure ◽  
Synthesis And Characterization ◽  
Chemically Vapor Deposited

Tem Characterization of Highly Oriented Diamond Films on (001) Silicon Synthesized by Bias Enhanced Nucleation Technique

1996 ◽  
Vol 458 ◽  
Author(s):  
Seung-Joon Jeon ◽  
Arun Kumar Chawla ◽  
Young-Joon Baik ◽  
Changmo Sung
Keyword(s):  
Surface Morphology ◽  
Growth Mechanism ◽  
Silicon Substrate ◽  
Three Dimensional ◽  
Diamond Films ◽  
Nucleation And Growth ◽  
Texture Formation ◽  
Tem Characterization ◽  
Nucleation And Growth Mechanism

ABSTRACTHighly oriented diamond films were deposited on a (001) silicon substrate by bias enhanced MPCVD technique. Three-dimensional TEM characterizations were carried out to understand the nucleation and growth mechanism of diamond grains. The surface morphology, defects, and misorientations of diamond films were compared as a function of synthesizing temperatures and thickness of the films. From our experimental results the texture formation mechanism of diamond films is discussed.

Characterization of low pressure deposited diamond films by X-ray photoelectron spectroscopy

1990 ◽  
Vol 193-194 ◽  
pp. 1079-1086 ◽  
Author(s):  
A.R Chourasia ◽  
D.R Chopra ◽  
S.C Sharma ◽  
M Green ◽  
C.A Dark ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Diamond Films ◽  
Low Pressure ◽  
X Ray
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