Resilience of tunneling magnetoresistive heads against electrical overstress

Davide Guarisco

doi:10.1063/1.2838018

Resilience of tunneling magnetoresistive heads against electrical overstress

Journal of Applied Physics ◽

10.1063/1.2838018 ◽

2008 ◽

Vol 103 (7) ◽

pp. 07F535 ◽

Cited By ~ 1

Author(s):

Davide Guarisco

Keyword(s):

Magnetoresistive Heads ◽

Electrical Overstress

Download Full-text

Electrical Overstress Protection of Submicron Devices.

10.21236/ada150334 ◽

1984 ◽

Author(s):

R. J. Antinone ◽

P. A. Young

Keyword(s):

Submicron Devices ◽

Electrical Overstress

Download Full-text

EOS (Electrical Overstress) Protection for VLSI (Very Large Scale Integration) Devices.

10.21236/ada150333 ◽

1984 ◽

Author(s):

D. D. Wilson ◽

W. E. Echols ◽

M. G. Rossi

Keyword(s):

Large Scale ◽

Very Large Scale Integration ◽

Large Scale Integration ◽

Electrical Overstress ◽

Scale Integration

Download Full-text

Wiley Series in Electrostatic Discharge ( ESD ) and Electrical Overstress ( EOS )

The ESD Handbook ◽

10.1002/9781119233091.app4 ◽

2021 ◽

pp. 1055-1056

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

Download Full-text

Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)

Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) ◽

10.1109/eosesd.1998.737011 ◽

1998 ◽

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

Download Full-text

Soft-adjacent-layer self-biased magnetoresistive heads in high-density recording

IEEE Transactions on Magnetics ◽

10.1109/tmag.1985.1063936 ◽

1985 ◽

Vol 21 (5) ◽

pp. 1563-1565 ◽

Cited By ~ 30

Author(s):

F. Jeffers ◽

J. Freeman ◽

R. Toussaint ◽

N. Smith ◽

D. Wachenschwanz ◽

...

Keyword(s):

High Density ◽

Adjacent Layer ◽

Magnetoresistive Heads ◽

High Density Recording

Download Full-text

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890020 ◽

2000 ◽

Keyword(s):

Electrostatic Discharge ◽

Electrical Overstress

Download Full-text

Magnetoresistive heads

Magnetic Information Storage Technology ◽

10.1016/b978-012734570-3/50009-1 ◽

1999 ◽

pp. 123-176 ◽

Cited By ~ 1

Author(s):

Shan X. Wang ◽

Alexander M. Taratorin

Keyword(s):

Magnetoresistive Heads

Download Full-text

Thermally excited magnetic noise from pinned and reference layers in current perpendicular-to-plane structure magnetoresistive heads

Journal of Applied Physics ◽

10.1063/1.2832881 ◽

2008 ◽

Vol 103 (7) ◽

pp. 07F516 ◽

Cited By ~ 5

Author(s):

Yuchen Zhou

Keyword(s):

Magnetic Noise ◽

Magnetoresistive Heads ◽

Current Perpendicular To Plane

Download Full-text

A simple transition response model for magnetoresistive heads on thin-film media

IEEE Transactions on Magnetics ◽

10.1109/20.560115 ◽

1997 ◽

Vol 33 (1) ◽

pp. 799-808 ◽

Cited By ~ 2

Author(s):

H.W. Wong-Lam

Keyword(s):

Thin Film ◽

Response Model ◽

Magnetoresistive Heads

Download Full-text

Thermal failure simulation for electrical overstress in semiconductor devices

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.393991 ◽

2002 ◽

Cited By ~ 2

Author(s):

C. Diaz ◽

C. Duvvury ◽

S.-M. Kang

Keyword(s):

Semiconductor Devices ◽

Thermal Failure ◽

Failure Simulation ◽

Electrical Overstress

Download Full-text