scholarly journals Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

2008 ◽  
Vol 103 (7) ◽  
pp. 07E505 ◽  
Author(s):  
A. Koblischka-Veneva ◽  
M. R. Koblischka ◽  
S. Murphy ◽  
S. K. Arora ◽  
F. Mücklich ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Misorientations in [0 0 1] Magnetite Thin Films Studied by Electron Backscatter Diffraction

2007 ◽  
Vol 13 (S03) ◽  
Author(s):  
A Koblischka-Veneva ◽  
M R Koblischka ◽  
F Mücklich ◽  
U Hartmann ◽  
S Murphy ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

2006 ◽  
Vol 22 (11) ◽  
pp. 1352-1358 ◽  
Author(s):  
C. Trager-Cowan ◽  
F. Sweeney ◽  
A. Winkelmann ◽  
A. J. Wilkinson ◽  
P. W. Trimby ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Electron Channelling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films

2015 ◽  
Vol 21 (S3) ◽  
pp. 1671-1672
Author(s):  
Eliot Estrine ◽  
Nicholas Seaton ◽  
Prabesh Dulal ◽  
Bethanie Stadler
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Au Thin Films ◽  
Backscatter Diffraction

Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device Performance

2015 ◽  
Vol 21 (4) ◽  
pp. 927-935 ◽  
Author(s):  
Matthew M. Nowell ◽  
Michael A. Scarpulla ◽  
Naba R. Paudel ◽  
Kristopher A. Wieland ◽  
Alvin D. Compaan ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Electron Backscatter Diffraction ◽  
Electrical Performance ◽  
Poor Correlation ◽  
Twin Boundaries ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractThe performance of polycrystalline CdTe photovoltaic thin films is expected to depend on the grain boundary density and corresponding grain size of the film microstructure. However, the electrical performance of grain boundaries within these films is not well understood, and can be beneficial, harmful, or neutral in terms of film performance. Electron backscatter diffraction has been used to characterize the grain size, grain boundary structure, and crystallographic texture of sputtered CdTe at varying deposition pressures before and after CdCl2 treatment in order to correlate performance with microstructure. Weak fiber textures were observed in the as-deposited films, with (111) textures present at lower deposition pressures and (110) textures observed at higher deposition pressures. The CdCl2-treated samples exhibited significant grain recrystallization with a high fraction of twin boundaries. Good correlation of solar cell efficiency was observed with twin-corrected grain size while poor correlation was found if the twin boundaries were considered as grain boundaries in the grain size determination. This implies that the twin boundaries are neutral with respect to recombination and carrier transport.

Electron backscatter diffraction analysis of ZnO:Al thin films

2012 ◽  
Vol 259 ◽  
pp. 590-595 ◽  
Author(s):  
C.B. Garcia ◽  
E. Ariza ◽  
C.J. Tavares ◽  
P. Villechaise
Keyword(s):  
Thin Films ◽  
Diffraction Analysis ◽  
Electron Backscatter Diffraction ◽  
Electron Backscatter ◽  
Backscatter Diffraction
Sign in / Sign up

Export Citation Format

Share Document