In situ spectroscopic ellipsometry growth studies on the Al-doped ZnO films deposited by remote plasma-enhanced metalorganic chemical vapor deposition
2009 ◽
Vol 39
(5)
◽
pp. 608-611
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2007 ◽
Vol 46
(No. 23)
◽
pp. L549-L551
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2010 ◽
Vol 42
(10)
◽
pp. 2834-2836
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1999 ◽
Vol 38
(Part 2, No. 6A/B)
◽
pp. L632-L635
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2009 ◽
Vol 6
(6)
◽
pp. 1464-1467
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2001 ◽
Vol 222
(3)
◽
pp. 511-517
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1999 ◽
pp. 1089-1092
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2005 ◽
Vol 44
(10)
◽
pp. 7267-7270
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