Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy

2007 ◽  
Vol 91 (24) ◽  
pp. 243102 ◽  
Author(s):  
S. Massenot ◽  
J. Grandidier ◽  
A. Bouhelier ◽  
G. Colas des Francs ◽  
L. Markey ◽  
...  
2011 ◽  
Vol 20 (7) ◽  
pp. 995-998 ◽  
Author(s):  
Oriane Mollet ◽  
Aurélien Cuche ◽  
Aurélien Drezet ◽  
Serge Huant

2012 ◽  
Vol 14 (1) ◽  
pp. 015003 ◽  
Author(s):  
D G Zhang ◽  
Q Fu ◽  
X X Wang ◽  
Y K Chen ◽  
P Wang ◽  
...  

2011 ◽  
Vol 19 (25) ◽  
pp. 25749 ◽  
Author(s):  
A. Hohenau ◽  
J. R. Krenn ◽  
A. Drezet ◽  
O. Mollet ◽  
S. Huant ◽  
...  

Nanomaterials ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 615
Author(s):  
Liwen Jiang ◽  
Xuqing Sun ◽  
Hongyao Liu ◽  
Ruxue Wei ◽  
Xue Wang ◽  
...  

Label-free, fast, and single nanoparticle detection is demanded for the in situ monitoring of nano-pollutants in the environment, which have potential toxic effects on human health. We present the label-free imaging of single nanoparticles by using total internal reflection (TIR)-based leakage radiation microscopy. We illustrate the imaging of both single polystyrene (PS) and Au nanospheres with diameters as low as 100 and 30 nm, respectively. As both far-field imaging and simulated near-field electric field intensity distribution at the interface showed the same characteristics, i.e., the localized enhancement and interference of TIR evanescent waves, we confirmed the leakage radiation, transforming the near-field distribution to far-field for fast imaging. The localized enhancement of single PS and Au nanospheres were compared. We also illustrate the TIR-based leakage radiation imaging of single polystyrene nanospheres with different incident polarizations. The TIR-based leakage radiation microscopy method is a competitive alternative for the fast, in situ, label-free imaging of nano-pollutants.


2012 ◽  
Vol 20 (5) ◽  
pp. 4893 ◽  
Author(s):  
Yannick Sonnefraud ◽  
Sarp Kerman ◽  
Giuliana Di Martino ◽  
Dang Yuan Lei ◽  
Stefan A. Maier

2020 ◽  
Vol 16 ◽  
pp. 102938 ◽  
Author(s):  
Yikai Chen ◽  
Shijun Zhu ◽  
Weiwei Kan ◽  
Fulian Chen ◽  
Lu Zhang ◽  
...  

2020 ◽  
Vol 31 (7) ◽  
pp. 075401
Author(s):  
Terry W K Chow ◽  
Daniel P K Lun ◽  
Suejit Pechprasarn ◽  
Michael G. Somekh

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