scholarly journals Systematic errors of bound-state parameters obtained with SVZ sum rules

2007 ◽  
Author(s):  
Wolfgang Lucha ◽  
Dmitri Melikhov ◽  
Silvano Simula ◽  
Pietro Colangelo ◽  
Donato Creanza ◽  
...  
Keyword(s):  
Sum Rules ◽  
Systematic Errors ◽  
Bound State

Study of systematic errors of bound-state parameters in SVZ sum rules

2008 ◽  
Vol 71 (8) ◽  
pp. 1461-1469 ◽  
Author(s):  
W. Lucha ◽  
D. I. Melikhov ◽  
S. Simula
Keyword(s):  
Sum Rules ◽  
Systematic Errors ◽  
Bound State

THE MASS OF A QUARK–SQUARK BOUND STATE FROM QCD SUM RULES

1999 ◽  
Vol 14 (30) ◽  
pp. 4763-4780
Author(s):  
M. MEYER-HERMANN ◽  
A. SCHÄFER
Keyword(s):  
Sum Rules ◽  
Mass Range ◽  
Bound State ◽  
Higher Order ◽  
Qcd Sum Rules ◽  
Mass Effects ◽  
Squark Mass

We give an estimate of the expected mass range for a possible two-quark two-squark bound state, using QCD sum rules. The sum rules are modified, taking mass effects into account, so that a treatment of heavy squarks becomes justified. The influence of the higher-order mass corrections and the possibility of a bound state mass below the squark mass are discussed.

scholarly journals Extraction of bound-state parameters from dispersive sum rules

2010 ◽  
Vol 73 (10) ◽  
pp. 1770-1780 ◽  
Author(s):  
W. Lucha ◽  
D. I. Melikhov ◽  
S. Simula
Keyword(s):  
Sum Rules ◽  
Bound State

scholarly journals Accuracy of bound-state form factors extracted from dispersive sum rules

2009 ◽  
Vol 671 (4-5) ◽  
pp. 445-449 ◽  
Author(s):  
Wolfgang Lucha ◽  
Dmitri Melikhov ◽  
Silvano Simula
Keyword(s):  
Sum Rules ◽  
Form Factors ◽  
Bound State ◽  
State Form

scholarly journals Bound-state parameters from dispersive sum rules for vacuum-to-vacuum correlators

2010 ◽  
Vol 37 (3) ◽  
pp. 035003 ◽  
Author(s):  
Wolfgang Lucha ◽  
Dmitri Melikhov ◽  
Silvano Simula
Keyword(s):  
Sum Rules ◽  
Bound State

Statistics and parallaxes

1978 ◽  
Vol 48 ◽  
pp. 7-29
Author(s):  
T. E. Lutz
Keyword(s):  
Experimental Design ◽  
Statistical Methods ◽  
Review Paper ◽  
Systematic Errors ◽  
Past Experience ◽  
Random Errors ◽  
Trigonometric Parallaxes ◽  
Systematic And Random Errors

This review paper deals with the use of statistical methods to evaluate systematic and random errors associated with trigonometric parallaxes. First, systematic errors which arise when using trigonometric parallaxes to calibrate luminosity systems are discussed. Next, determination of the external errors of parallax measurement are reviewed. Observatory corrections are discussed. Schilt’s point, that as the causes of these systematic differences between observatories are not known the computed corrections can not be applied appropriately, is emphasized. However, modern parallax work is sufficiently accurate that it is necessary to determine observatory corrections if full use is to be made of the potential precision of the data. To this end, it is suggested that a prior experimental design is required. Past experience has shown that accidental overlap of observing programs will not suffice to determine observatory corrections which are meaningful.

Dielectronic Recombination in the Average-Atom Model

1988 ◽  
Vol 102 ◽  
pp. 215
Author(s):  
R.M. More ◽  
G.B. Zimmerman ◽  
Z. Zinamon
Keyword(s):  
Detailed Balance ◽  
Systematic Errors ◽  
Dielectronic Recombination ◽  
Rate Equations ◽  
Strong Correlations ◽  
Dense Plasmas ◽  
Atom Model ◽  
New Feature ◽  
Average Atom Model ◽  
Attachment Process

Autoionization and dielectronic attachment are usually omitted from rate equations for the non–LTE average–atom model, causing systematic errors in predicted ionization states and electronic populations for atoms in hot dense plasmas produced by laser irradiation of solid targets. We formulate a method by which dielectronic recombination can be included in average–atom calculations without conflict with the principle of detailed balance. The essential new feature in this extended average atom model is a treatment of strong correlations of electron populations induced by the dielectronic attachment process.

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