Portable x-ray fluorescence spectrometer for coating thickness measurement

Alain Carapelle; Karl Fleury-Frenette; Jean-Paul Collette; Henri-Pierre Garnir; Philippe Harlet

doi:10.1063/1.2822613

Portable x-ray fluorescence spectrometer for coating thickness measurement

Review of Scientific Instruments ◽

10.1063/1.2822613 ◽

2007 ◽

Vol 78 (12) ◽

pp. 123109 ◽

Cited By ~ 9

Author(s):

Alain Carapelle ◽

Karl Fleury-Frenette ◽

Jean-Paul Collette ◽

Henri-Pierre Garnir ◽

Philippe Harlet

Keyword(s):

Coating Thickness ◽

Thickness Measurement ◽

X Ray ◽

Coating Thickness Measurement ◽

Fluorescence Spectrometer

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Parameters selection for different metals in coating thickness measurement using x-ray fluorescence analysis

9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subdiffraction-limited Plasmonic Lithography and Innovative Manufacturing Technology ◽

10.1117/12.2504972 ◽

2019 ◽

Author(s):

Jie Rong ◽

Xiaoping Zhu ◽

Hua Du ◽

Kai Wang

Keyword(s):

Coating Thickness ◽

Fluorescence Analysis ◽

Thickness Measurement ◽

X Ray ◽

Parameters Selection ◽

Coating Thickness Measurement ◽

Selection For

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Handheld modern computer brings new features to portable X-ray fluorescence coating thickness measurement device

Computer Physics Communications ◽

10.1016/j.cpc.2011.03.008 ◽

2011 ◽

Vol 182 (6) ◽

pp. 1304-1306 ◽

Cited By ~ 3

Author(s):

Alain Carapelle ◽

Jean-Marc Defise ◽

David Strivay ◽

Henri-Pierre Garnir

Keyword(s):

Coating Thickness ◽

Thickness Measurement ◽

Measurement Device ◽

X Ray ◽

Modern Computer ◽

Coating Thickness Measurement

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An X-ray fluorescence method for coating thickness measurement

X-Ray Spectrometry ◽

10.1002/xrs.1300080106 ◽

1979 ◽

Vol 8 (1) ◽

pp. 11-13 ◽

Cited By ~ 7

Author(s):

S. K. Jain ◽

P. P. Gupta ◽

A. C. Eapen

Keyword(s):

Coating Thickness ◽

Thickness Measurement ◽

Fluorescence Method ◽

X Ray ◽

Coating Thickness Measurement

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X‐Ray Fluorescence for Coating Thickness Measurement

Circuit World ◽

10.1108/eb045973 ◽

1983 ◽

Vol 10 (1) ◽

pp. 20-25 ◽

Cited By ~ 7

Author(s):

T.D.T. Latter

Keyword(s):

Coating Thickness ◽

Thickness Measurement ◽

X Ray ◽

Coating Thickness Measurement

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X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

Advanced Powder Technology ◽

10.1016/j.apt.2010.08.002 ◽

2010 ◽

Vol 21 (6) ◽

pp. 663-675 ◽

Cited By ~ 32

Author(s):

Giacomo Perfetti ◽

Elke Van de Casteele ◽

Bernd Rieger ◽

Willem J. Wildeboer ◽

Gabrie M.H. Meesters

Keyword(s):

Image Analysis ◽

Coating Thickness ◽

Thickness Measurement ◽

Morphological Characterization ◽

Coated Particles ◽

X Ray ◽

Complementary Methods ◽

Coating Thickness Measurement ◽

Micro Tomography

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Coating thickness measurement of thin gold and palladium coatings on printed circuit boards using X‐ray fluorescence

Circuit World ◽

10.1108/03056121111128288 ◽

2011 ◽

Vol 37 (2) ◽

pp. 20-26 ◽

Cited By ~ 5

Author(s):

Simone Dill ◽

Volker Rößiger

Keyword(s):

Coating Thickness ◽

Printed Circuit Boards ◽

Thickness Measurement ◽

Circuit Boards ◽

X Ray ◽

Printed Circuit ◽

Coating Thickness Measurement

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X-ray fluorescence coating thickness measurement.

Journal of The Surface Finishing Society of Japan ◽

10.4139/sfj.40.220 ◽

1989 ◽

Vol 40 (2) ◽

pp. 220-225 ◽

Cited By ~ 1

Author(s):

Masao SATOH

Keyword(s):

Coating Thickness ◽

Thickness Measurement ◽

X Ray ◽

Coating Thickness Measurement

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Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays

Advances in X-ray Analysis ◽

10.1154/s0376030800005917 ◽

1968 ◽

Vol 12 ◽

pp. 446-456 ◽

Cited By ~ 4

Author(s):

Toshio Shiraiwa ◽

Nobukatsu Fujino

Keyword(s):

Film Thickness ◽

Coating Thickness ◽

Thickness Measurement ◽

Enhancement Effect ◽

X Rays ◽

Ray Method ◽

X Ray ◽

Coating Thickness Measurement ◽

Film Thickness Measurement ◽

Theoretical Results

AbstractThe fluorescence x-ray method of the coating thickness measurement is theoretically studied. The theoretical formulas of the fluorescence x-ray intensity from the coating and from the substrate are obtained which include the enhancement effect between the coating and the substrate. The formulas are applied to the following examples and are confirmed experimentally: zinc on steel; tin on steel; aluminum on steel and on PMMA. The experimental results agree well with the theoretical results.

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