The study of electrical characteristics of heterojunction based on ZnO nanowires using ultrahigh-vacuum conducting atomic force microscopy

2007 ◽  
Vol 91 (23) ◽  
pp. 233105 ◽  
Author(s):  
J. H. He ◽  
C. H. Ho
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrahigh Vacuum ◽  
Zno Nanowires ◽  
Electrical Characteristics ◽  
Force Microscopy ◽  
Atomic Force

Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

1998 ◽  
Vol 69 (4) ◽  
pp. 1757-1764 ◽  
Author(s):  
M. A. Lantz ◽  
S. J. O’Shea ◽  
M. E. Welland
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrahigh Vacuum ◽  
Force Microscopy ◽  
Atomic Force

Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB05 ◽  
Author(s):  
Tomoharu Kimura ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Point Contact ◽  
Electrical Characteristics ◽  
Force Microscopy ◽  
Atomic Force

Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films

2010 ◽  
Vol 644 ◽  
pp. 109-112
Author(s):  
N. Muñoz Aguirre ◽  
J. Eduardo Rivera-López ◽  
L. Martínez Pérez ◽  
Pedro A. Tamayo Meza
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Spray Pyrolysis Technique ◽  
Water Mist ◽  
Zno Thin Films ◽  
Electrical Characteristics ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Doped Zno

Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

scholarly journals Time- and Temperature-Dependent Growth Behavior of Ionic Liquids on Au(111) Studied by Atomic Force Microscopy in Ultrahigh Vacuum

2021 ◽  
Vol 125 (37) ◽  
pp. 20439-20449
Author(s):  
Manuel Meusel ◽  
Afra Gezmis ◽  
Simon Jaekel ◽  
Matthias Lexow ◽  
Andreas Bayer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquids ◽  
Ultrahigh Vacuum ◽  
Growth Behavior ◽  
Temperature Dependent ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dependent Growth

scholarly journals Growth of Multilayers of Ionic Liquids on Au(111) Investigated by Atomic Force Microscopy in Ultrahigh Vacuum

Langmuir ◽  
2020 ◽  
Vol 36 (45) ◽  
pp. 13670-13681
Author(s):  
Manuel Meusel ◽  
Matthias Lexow ◽  
Afra Gezmis ◽  
Andreas Bayer ◽  
Florian Maier ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquids ◽  
Ultrahigh Vacuum ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy in Ultrahigh Vacuum

1994 ◽  
Vol 33 (Part 1, No. 6B) ◽  
pp. 3726-3734 ◽  
Author(s):  
Franz Josef Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrahigh Vacuum ◽  
Force Microscopy ◽  
Atomic Force

Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy

1994 ◽  
Vol 33 (Part 1, No. 6B) ◽  
pp. 3735-3738 ◽  
Author(s):  
Masami Kageshima ◽  
Hirofumi Yamada ◽  
Yukinori Morita ◽  
Hiroshi Tokumoto ◽  
Kan Nakayama ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrahigh Vacuum ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Disorder
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