Point-spread-function Engineering in High-NA Optical Scanning Microscopy: Desensitizing to Sample-induced Aberrations

2007 ◽  
Author(s):  
Genaro Saavedra ◽  
Isabel Escobar ◽  
Manuel Martinez-Corral ◽  
Jón Atli Benediktsson ◽  
Bahram Javidi ◽  
...  
Keyword(s):  
Point Spread Function ◽  
Scanning Microscopy ◽  
Optical Scanning ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering

scholarly journals Mutifocal image scanning microscopy based on double-helix point spread function engineering

2021 ◽  
Vol 70 (3) ◽  
pp. 038701-038701
Author(s):  
Li Si-Wei ◽  
◽  
Lin Dan-Ying ◽  
Zou Xiao-Hui ◽  
Zhang Wei ◽  
...  
Keyword(s):  
Point Spread Function ◽  
Double Helix ◽  
Scanning Microscopy ◽  
Image Scanning ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering

scholarly journals High-fidelity structured illumination microscopy by point-spread-function engineering

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Gang Wen ◽  
Simin Li ◽  
Linbo Wang ◽  
Xiaohu Chen ◽  
Zhenglong Sun ◽  
...  
Keyword(s):  
Point Spread Function ◽  
Super Resolution ◽  
Reconstruction Algorithm ◽  
High Fidelity ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Imaging Tool ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering

AbstractStructured illumination microscopy (SIM) has become a widely used tool for insight into biomedical challenges due to its rapid, long-term, and super-resolution (SR) imaging. However, artifacts that often appear in SIM images have long brought into question its fidelity, and might cause misinterpretation of biological structures. We present HiFi-SIM, a high-fidelity SIM reconstruction algorithm, by engineering the effective point spread function (PSF) into an ideal form. HiFi-SIM can effectively reduce commonly seen artifacts without loss of fine structures and improve the axial sectioning for samples with strong background. In particular, HiFi-SIM is not sensitive to the commonly used PSF and reconstruction parameters; hence, it lowers the requirements for dedicated PSF calibration and complicated parameter adjustment, thus promoting SIM as a daily imaging tool.

Point spread function engineering with multiphoton SPIFI

2016 ◽  
Author(s):  
Keith A. Wernsing ◽  
Jeffrey J. Field ◽  
Scott R. Domingue ◽  
Alyssa M. Allende-Motz ◽  
Keith F. DeLuca ◽  
...  
Keyword(s):  
Point Spread Function ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering

scholarly journals Fourier optics approach to imaging with sub-wavelength resolution through metal-dielectric multilayers

2010 ◽  
Vol 18 (4) ◽  
Author(s):  
R. Kotyński
Keyword(s):  
Point Spread Function ◽  
Imaging System ◽  
Diffraction Theory ◽  
Spatial Filter ◽  
Fourier Optics ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering ◽  
Wavelength Resolution ◽  
Sub Wavelength

AbstractMetal-dielectric layered stacks for imaging with sub-wavelength resolution are regarded as linear isoplanatic systems — a concept popular in Fourier optics and in scalar diffraction theory. In this context, a layered flat lens is a one-dimensional spatial filter characterised by the point spread function. However, depending on the model of the source, the definition of the point spread function for multilayers with sub-wavelength resolution may be formulated in several ways. Here, a distinction is made between a soft source and hard electric or magnetic sources. Each of these definitions leads to a different meaning of perfect imaging. It is shown that some simple interpretations of the PSF, such as the relation of its width to the resolution of the imaging system are ambiguous for the multilayers with sub-wavelenth resolution. These differences must be observed in point spread function engineering of layered systems with sub-wavelength sized PSF.

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