Far-infrared, Raman spectroscopy, and microwave dielectric properties of La(Mg0.5Ti(0.5−x)Snx)O3 ceramics

2007 ◽  
Vol 102 (6) ◽  
pp. 064906 ◽  
Author(s):  
G. Santosh Babu ◽  
V. Subramanian ◽  
V. R. K. Murthy ◽  
I-Nan Lin ◽  
Chia-Ta Chia ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Far Infrared ◽  
Microwave Dielectric

scholarly journals Effects of (Mg1/3Sb2/3)4+ Substitution on the Structure and Microwave Dielectric Properties of Ce2Zr3x(Mg1/3Sb2/3)3-3x(MoO4)9 Ceramics

2020 ◽  
Author(s):  
Zhou Xu ◽  
Sun Jiajia ◽  
Zhang Ningkang ◽  
Sun Huazhang ◽  
Tao Wenhong ◽  
...  
Keyword(s):  
Dielectric Properties ◽  
Single Phase ◽  
Microwave Dielectric Properties ◽  
Far Infrared ◽  
Structural Refinement ◽  
X Ray Diffraction ◽  
Solid State Method ◽  
Microwave Dielectric ◽  
Refinement Method ◽  
Traditional Solid State Method

Abstract Ce2[Zr1-x(Mg1/3Sb2/3)x]3(MoO4)9 (0.02≤x≤0.10) ceramics were prepared well through the traditional solid-state method. A single phase, belonging to the space group of R-3c, was detected by using X-ray diffraction at sintering temperatures ranging from 700 to 850 °C. The crystallization micro-structural of specimens was examined by applying Scanning electron microscopy. The structural refinement of these samples was investigated in detail by performing the Rietveld refinement method. The intrinsic properties were calculated and explored via far-infrared reflectivity spectroscopy. The correlations between the chemical bonds parameters and microwave dielectric properties were calculated and analyzed by P-V-L theory. Ce2[Zr0.94(Mg1/3Sb2/3)0.06]3(MoO4)9 ceramics with excellent dielectric properties: εr = 10.37, Q×f = 71748 GHz and τf = −13.6 ppm/°C sintered at 725 °C for 6 hours.

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