Critical current densities and the structural quality of 3- and 4-μm-thick superconducting YBa2Cu3O7 layers synthesized using theex situprocess

2007 ◽  
Vol 102 (5) ◽  
pp. 053902 ◽  
Author(s):  
Vyacheslav F. Solovyov ◽  
Harold J. Wiesmann ◽  
Masaki Suenaga
1993 ◽  
Vol 8 (11) ◽  
pp. 2780-2784 ◽  
Author(s):  
P. Scardi ◽  
L. Lutterotti ◽  
L. Correra ◽  
S. Nicoletti

We discuss the results obtained for SrTiO3/YBa2Cu3O7 layers deposited on (001) MgO substrates by UV pulsed laser ablation. Different samples were prepared to study both the growth of a thin (55 nm) layer of SrTiO3 on MgO and the successive epitaxy of a 220 nm YBa2Cu3O7 (YBCO) film on the SrTiO3 layer. An x-ray diffraction (XRD) texture analysis is reported for the bilayers together with resistivity versus temperature and critical current density (Jc) measurements of the superconducting films. The results show that YBCO grains grow with c-axis normal to the surface; the main in-plane orientations are [100] MgO // [100] SrTiO3 // [100] YBCO ([010] YBCO). The XRD line broadening analysis suggests that YBCO columnar grains grow along the whole thickness of the film, also evidencing dislocations and/or faulting separated by a mean distance of 80 nm. The values obtained for the critical current of the superconductor demonstrate the effectiveness of the SrTiO3 intermediate layer in improving the structural quality of the YBCO film.


Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.


2020 ◽  
Vol 96 (3s) ◽  
pp. 154-159
Author(s):  
Н.Н. Егоров ◽  
С.А. Голубков ◽  
С.Д. Федотов ◽  
В.Н. Стаценко ◽  
А.А. Романов ◽  
...  

Высокая плотность структурных дефектов является основной проблемой при изготовлении электроники на гетероструктурах «кремний на сапфире» (КНС). Современный метод получения ультратонких структур КНС с помощью твердофазной эпитаксиальной рекристаллизации позволяет значительно снизить дефектность в гетероэпитаксиальном слое КНС. В данной работе ультратонкие (100 нм) слои КНС были получены путем рекристаллизации и утонения субмикронных (300 нм) слоев кремния на сапфире, обладающих различным структурным качеством. Плотность структурных дефектов в слоях КНС оценивалась с помощью рентгеноструктурного анализа и просвечивающей электронной микроскопии. Кривые качания от дифракционного отражения Si(400), полученные в ω-геометрии, продемонстрировали максимальную ширину на полувысоте пика не более 0,19-0,20° для ультратонких слоев КНС толщиной 100 нм. Формирование структурно совершенного субмикронного слоя КНС 300 нм на этапе газофазной эпитаксии обеспечивает существенное уменьшение плотности дислокаций в ультратонком кремнии на сапфире до значений ~1 • 104 см-1. Тестовые n-канальные МОП-транзисторы на ультратонких структурах КНС характеризовались подвижностью носителей в канале 725 см2 Вс-1. The high density of structural defects is the main problem on the way to the production of electronics on silicon-on-sapphire (SOS) heteroepitaxial wafers. The modern method of obtaining ultrathin SOS wafers is solid-phase epitaxial recrystallization which can significantly reduce the density of defects in the SOS heteroepitaxial layers. In the current work, ultrathin (100 nm) SOS layers were obtained by recrystallization and thinning of submicron (300 nm) SOS layers, which have various structural quality. The density of structural defects in the layers was estimated by using XRD and TEM. Full width at half maximum of rocking curves (ω-geometry) was no more than 0.19-0.20° for 100 nm ultra-thin SOS layers. The structural quality of 300 nm submicron SOS layers, which were obtained by CVD, depends on dislocation density in 100 nm ultrathin layers. The dislocation density in ultrathin SOS layers was reduced by ~1 • 104 cm-1 due to the utilization of the submicron SOS with good crystal quality. Test n-channel MOS transistors based on ultra-thin SOS wafers were characterized by electron mobility in the channel 725 cm2 V-1 s-1.


2021 ◽  
Vol 30 (1) ◽  
pp. 41-48
Author(s):  
Gary W. Evans

Child development reflects interactions between personal characteristics and the physical and social environment. Psychology, however, lacks analysis of physical features that influence child development. In this article, I describe a preliminary taxonomy of physical-setting characteristics that can influence child development, focusing on environmental stressors such as noise, crowding, and chaos along with structural quality of housing, day care, and schools. Adverse outcomes associated with suboptimal physical settings during childhood include cognitive and socioemotional difficulties along with chronic physiological stress. Both direct effects on the child as well as indirect effects occurring via significant persons surrounding the child are described. Methodological limitations, particularly reliance on observational studies, are a weakness in the current literature, but increasingly more rigorously obtained findings yield converging evidence of the effects of physical settings on child development.


Molecules ◽  
2021 ◽  
Vol 26 (15) ◽  
pp. 4442
Author(s):  
Michela Costantini ◽  
Carmine Summo ◽  
Michele Faccia ◽  
Francesco Caponio ◽  
Antonella Pasqualone

Gluten-free (GF) products, including pasta, are often characterised by nutritional deficiencies, such as scarce dietary fibre and excess of calories. Chickpea flour is increasingly being used by the food industries. Hulls, rich in dietary fibre and bioactive compounds, are discarded after milling. The aim of this work was to evaluate the quality features of short-cut GF fresh pasta added of hull (8% w/w) derived from kabuli (KH) or Apulian black (ABH) chickpeas, in comparison with control GF pasta prepared without hull. The enriched pasta, which could be labelled as “high fibre”, was characterised by a higher level of bioactive compounds and antioxidant activity than the control. ABH-enriched pasta showed the highest anthocyanins (33.37 ± 1.20 and 20.59 ± 0.11 mg/kg of cyanidin-3-O-glucoside on dry matter in raw and cooked pasta, respectively). Hull addition increased colour intensity and structural quality of GF pasta: ABH-enriched pasta had the lowest cooking loss and the highest water absorption capacity; KH-enriched pasta showed the highest firmness. No significant differences in sensory liking were found among the samples, except for “aftertaste”. Chickpea hull can be used as an innovative ingredient to produce potentially functional GF pasta, meeting the dietary needs of consumers without affecting quality.


2006 ◽  
Vol 89 (13) ◽  
pp. 132510 ◽  
Author(s):  
Xianping Zhang ◽  
Zhaoshun Gao ◽  
Dongliang Wang ◽  
Zhengguang Yu ◽  
Yanwei Ma ◽  
...  

Cryogenics ◽  
1994 ◽  
Vol 34 (4) ◽  
pp. 329-334
Author(s):  
H.L Ji ◽  
Z.X Shi ◽  
Z.Y Zeng ◽  
X Jin ◽  
H.C Fan ◽  
...  

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Zhigang Li ◽  
Weike Wang ◽  
Li Zhang ◽  
Zhaorong Yang ◽  
Mingliang Tian ◽  
...  

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