Erratum: “Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical-state analysis of environmental samples” [Rev. Sci. Instrum. 78, 073105 (2007)]

2007 ◽  
Vol 78 (8) ◽  
pp. 089901
Author(s):  
J. Hasegawa ◽  
T. Tada ◽  
Y. Oguri ◽  
M. Hayashi ◽  
T. Toriyama ◽  
...  
Keyword(s):  
High Resolution ◽  
Environmental Samples ◽  
High Efficiency ◽  
Chemical State ◽  
X Ray ◽  
Emission System ◽  
State Analysis

Chemical state analysis of vanadium by high resolution X-ray spectroscopy

1975 ◽  
Vol 4 (3) ◽  
pp. 117-118 ◽  
Author(s):  
Y. Gohshi ◽  
T. Nakamura ◽  
M. Yoshimura
Keyword(s):  
High Resolution ◽  
Chemical State ◽  
X Ray ◽  
State Analysis

HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS

1996 ◽  
Vol 06 (01n02) ◽  
pp. 97-116 ◽  
Author(s):  
KUNIKO MAEDA ◽  
HIROMI HAMANAKA ◽  
KEN-ICHI HASEGAWA
Keyword(s):  
High Resolution ◽  
Elemental Analysis ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
State Analysis

We describe characteristics of high-resolution, wavelength-dispersive crystal spectrometers equipped with a different type of position sensitive X-ray detectors: PSPC, CCD, IP and MCP. Utilities of these position sensitive spectrometers in PIXE experiments are demonstrated by referring several recent topics of elemental analysis, chemical state analysis and a study on sample charging.

Chemical State Analysis using a Gearless Two-Crystal X-Ray Spectrometer

1991 ◽  
Vol 35 (A) ◽  
pp. 393-399
Author(s):  
Tokuzo Konishi ◽  
Kazuo Nishihagi ◽  
Kazuo Taniguchi
Keyword(s):  
High Resolution ◽  
Systematic Study ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Analyzer Crystal ◽  
Chemical Effects ◽  
Scanning Range ◽  
State Analysis

A two-crystal spectrometer for chemical state analysis by high-resolution x-ray fluorescence spectrometry employs hall-screw and slide mechanisms rather than gears to obtain a 2θ scanning range of 40° -147°; a Δ2θ scanning step of 10−4 deg under vacuus; a 2θ resolution of 10−4 deg in determination of an intercrystal angle with encoder-based measurement; and servomechanical control of position. The spectrometer, although simple in structure, is a powerful instrument for chemical state analysis, as demonstrated by its high resolution, precision, and stability; as demonstrated in the determination of the Kα1 lines of first transition metals with Si(220) as analyzer crystal, and in its application to a systematic study of the chemical effects on Ni Kα1 and Kα2.

High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

2000 ◽  
Vol 55 (9) ◽  
pp. 1385-1395 ◽  
Author(s):  
Jun Kawai ◽  
Yoshinobu Mizutani ◽  
Tetsuro Sugimura ◽  
Makoto Sai ◽  
Tohru Higuchi ◽  
...  
Keyword(s):  
High Resolution ◽  
Absorption Spectroscopy ◽  
Chemical State ◽  
X Ray ◽  
X Ray Absorption ◽  
State Analysis
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