Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation

2007 ◽  
Vol 91 (5) ◽  
pp. 053112 ◽  
Author(s):  
M. Prior ◽  
A. Makarovski ◽  
G. Finkelstein
Keyword(s):  
Carbon Nanotube ◽  
Low Temperature ◽  
Atomic Force Microscope ◽  
Atomic Force

Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope

2022 ◽  
Author(s):  
Sanjeev Kumar Kanth ◽  
Anjli Sharma ◽  
Byong Chon Park ◽  
Woon Song ◽  
Hyun Rhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Structural Integrity ◽  
Ion Beam ◽  
Rectilinear Motion ◽  
Atomic Force ◽  
Scanning Electron

Abstract We have constructed a new nanomanipulator (NM) in a field emission scanning electron microscope (FE-SEM) to fabricate carbon nanotube (CNT) tip to precisely adjust the length and attachment angle of CNT onto the mother atomic force microscope (AFM) tip. The new NM is composed of 2 modules, each of which has the degree of freedom of three-dimensional rectilinear motion x, y and z and one-dimensional rotational motion θ. The NM is mounted on the stage of a FE-SEM. With the system of 14 axes in total which includes 5 axes of FE-SEM and 9 axes of nano-actuators, it was possible to see CNT tip from both rear and side view about the mother tip. With the help of new NM, the attachment angle error could be reduced down to 0º as seen from both the side and the rear view, as well as, the length of the CNT could be adjusted with the precision using electron beam induced etching. For the proper attachment of CNT on the mother tip surface, the side of the mother tip was milled with focused ion beam. In addition, electron beam induced deposition was used to strengthen the adhesion between CNT and the mother tip. In order to check the structural integrity of fabricated CNT, transmission electron microscope image was taken which showed the fine cutting of CNT and the clean surface as well. Finally, the performance of the fabricated CNT tip was demonstrated by imaging 1-D grating and DNA samples with atomic force microscope in tapping mode.

Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry

2011 ◽  
Vol 82 (2) ◽  
pp. 023705 ◽  
Author(s):  
U. Gysin ◽  
S. Rast ◽  
M. Kisiel ◽  
C. Werle ◽  
E. Meyer
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Force

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

Triple-probe Atomic Force Microscope: Measuring a carbon nanotube/DNA MIS-FET

2002 ◽  
Vol 761 ◽  
Author(s):  
Kei Shimotani ◽  
Hiroyuki Watanabe ◽  
Chikara Manabe ◽  
Taishi Shigematsu ◽  
Masaaki Shimizu
Keyword(s):  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Gate Insulator ◽  
Switching Behavior ◽  
Insulator Layer ◽  
Terminal Device ◽  
Atomic Force ◽  
Current Voltage ◽  
Dna Strands ◽  
Walled Carbon Nanotubes

ABSTRACTWe have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of “Nanotweezers” and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.

Carbon Nanotube as Probe for Atomic Force Microscope

2006 ◽  
Vol 315-316 ◽  
pp. 758-761
Author(s):  
Zong Wei Xu ◽  
Ying Chun Liang ◽  
Shen Dong ◽  
Li Qiang Gu ◽  
T. Sun ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Aspect Ratio ◽  
Atomic Force Microscope ◽  
Arc Welding ◽  
Metal Film ◽  
Optical Microscope ◽  
Fabrication Method ◽  
Easy Method ◽  
Atomic Force ◽  
Direct View

An improved arc welding method was developed to fabricate carbon nanotube probe under direct view of optical microscope. The new fabrication method here needs not coat silicon probe in advance with metal film, which greatly reduces the fabrication’s difficulty. An easy method for shortening the nanotube probe was also developed. The improved fabrication method here is simple and reliable. The fabricated carbon nanotube probe showed good properties of higher length-to-diameter aspect ratio, better wear characteristics than silicon probe.

Single-wall carbon nanotube atomic force microscope probes

2002 ◽  
Vol 80 (11) ◽  
pp. 2002-2004 ◽  
Author(s):  
E. S. Snow ◽  
P. M. Campbell ◽  
J. P. Novak
Keyword(s):  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Single Wall Carbon Nanotube ◽  
Single Wall Carbon ◽  
Atomic Force
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