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Accurate experimental determination of the Poisson’s ratio of GaN using high-resolution x-ray diffraction
Journal of Applied Physics
◽
10.1063/1.2749484
◽
2007
◽
Vol 102
(2)
◽
pp. 023505
◽
Cited By ~ 71
Author(s):
M. A. Moram
◽
Z. H. Barber
◽
C. J. Humphreys
Keyword(s):
High Resolution
◽
Experimental Determination
◽
Poisson’S Ratio
◽
Poisson's Ratio
◽
X Ray Diffraction
◽
X Ray
Download Full-text
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References
Determination of Young's modulus and Poisson's ratio of thin films by combining sin2ψ X-ray diffraction and laser curvature methods
Thin Solid Films
◽
10.1016/j.tsf.2009.05.042
◽
2009
◽
Vol 517
(24)
◽
pp. 6759-6766
◽
Cited By ~ 17
Author(s):
Jeh-Yin Chang
◽
Ge-Ping Yu
◽
Jia-Hong Huang
Keyword(s):
Thin Films
◽
Young’S Modulus
◽
Poisson’S Ratio
◽
Young's Modulus
◽
Poisson's Ratio
◽
X Ray Diffraction
◽
X Ray
Download Full-text
Experimental determination of Poisson’s ratio of a single crystal nickel heat-resistant alloy in the temperature range of 20–1000°C
The Physics of Metals and Metallography
◽
10.1134/s0031918x17070043
◽
2017
◽
Vol 118
(9)
◽
pp. 922-927
Author(s):
S. A. Golynets
◽
V. N. Toloraiya
◽
S. N. Nekrasov
◽
K. K. Khvatskii
Keyword(s):
Single Crystal
◽
Experimental Determination
◽
Poisson’S Ratio
◽
Poisson's Ratio
◽
Temperature Range
◽
Heat Resistant Alloy
◽
Resistant Alloy
◽
Heat Resistant
Download Full-text
Determination of twist angle of in-plane mosaic spread of GaN films by high-resolution X-ray diffraction
Journal of Crystal Growth
◽
10.1016/s0022-0248(03)01211-9
◽
2003
◽
Vol 255
(1-2)
◽
pp. 63-67
◽
Cited By ~ 71
Author(s):
X.H. Zheng
◽
H. Chen
◽
Z.B. Yan
◽
Y.J. Han
◽
H.B. Yu
◽
...
Keyword(s):
High Resolution
◽
Twist Angle
◽
X Ray Diffraction
◽
X Ray
◽
Mosaic Spread
Download Full-text
Experimental Determination of the Poisson's Ratio and the Elastic Modulus of a Sand-Plastic Composite Material
International Journal of Engineering Research
◽
10.5958/2319-6890.2017.00021.6
◽
2017
◽
Vol 6
(6)
◽
pp. 292
◽
Cited By ~ 1
Author(s):
Moro Olivier Boffoue
◽
Brahiman Traore
◽
Conand Honoré Kouakou
◽
Kokou Esso Atcholi
◽
Remy Lachat
◽
...
Keyword(s):
Composite Material
◽
Elastic Modulus
◽
Experimental Determination
◽
Poisson’S Ratio
◽
Poisson's Ratio
◽
Plastic Composite
Download Full-text
Experimental determination of residual stress in silicon nitride diffusion bonds obtained by high-energy X-ray diffraction
Powder Technology
◽
10.1016/j.powtec.2004.09.035
◽
2004
◽
Vol 148
(1)
◽
pp. 60-63
◽
Cited By ~ 4
Author(s):
M. Vila
◽
M.L. Martínez
◽
C. Prieto
◽
P. Miranzo
◽
M.I. Osendi
◽
...
Keyword(s):
Residual Stress
◽
Silicon Nitride
◽
Experimental Determination
◽
High Energy
◽
X Ray Diffraction
◽
X Ray
◽
Diffusion Bonds
Download Full-text
Experimental determination of Poisson's ratio of fissured media
Journal of Soviet Mathematics
◽
10.1007/bf01097108
◽
1990
◽
Vol 50
(4)
◽
pp. 1771-1774
Author(s):
L. A. Molotkov
◽
P. V. Krauklis
Keyword(s):
Experimental Determination
◽
Poisson’S Ratio
◽
Poisson's Ratio
Download Full-text
High-pressure X-ray diffraction experiments on icosahedral Ti-Zr-Ni — evidence for a low shear modulus and a high poisson's ratio
Ferroelectrics
◽
10.1080/00150190108225080
◽
2001
◽
Vol 250
(1)
◽
pp. 269-272
◽
Cited By ~ 3
Author(s):
U. Ponkratz
◽
R. Nicula
◽
A. Jianu
◽
E. Burkel
Keyword(s):
High Pressure
◽
Shear Modulus
◽
Poisson’S Ratio
◽
Poisson's Ratio
◽
X Ray Diffraction
◽
X Ray
◽
Low Shear
Download Full-text
Grueneisen-approach for the experimental determination of transient spin and phonon energies from ultrafast x-ray diffraction data: gadolinium
Journal of Physics Condensed Matter
◽
10.1088/1361-648x/aa7187
◽
2017
◽
Vol 29
(26)
◽
pp. 264001
◽
Cited By ~ 4
Author(s):
A Koc
◽
M Reinhardt
◽
A von Reppert
◽
M Rössle
◽
W Leitenberger
◽
...
Keyword(s):
Experimental Determination
◽
Diffraction Data
◽
X Ray Diffraction
◽
X Ray
Download Full-text
Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
Materials Science Forum
◽
10.4028/www.scientific.net/msf.79-82.165
◽
1991
◽
Vol 79-82
◽
pp. 165-168
Author(s):
H.-G. Brühl
◽
H. Rhan
Keyword(s):
High Resolution
◽
Layer Thickness
◽
Epitaxial Layers
◽
X Ray Diffraction
◽
X Ray
Download Full-text
Composition determination of β-(AlxGa1−x)2O3layers coherently grown on (010) β-Ga2O3substrates by high-resolution X-ray diffraction
Applied Physics Express
◽
10.7567/apex.9.061102
◽
2016
◽
Vol 9
(6)
◽
pp. 061102
◽
Cited By ~ 58
Author(s):
Yuichi Oshima
◽
Elaheh Ahmadi
◽
Stefan C. Badescu
◽
Feng Wu
◽
James S. Speck
Keyword(s):
High Resolution
◽
X Ray Diffraction
◽
X Ray
◽
Composition Determination
Download Full-text
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