Easy and direct method for calibrating atomic force microscopy lateral force measurements

Wenhua Liu; Keith Bonin; Martin Guthold

doi:10.1063/1.2745733

Easy and direct method for calibrating atomic force microscopy lateral force measurements

Review of Scientific Instruments ◽

10.1063/1.2745733 ◽

2007 ◽

Vol 78 (6) ◽

pp. 063707 ◽

Cited By ~ 57

Author(s):

Wenhua Liu ◽

Keith Bonin ◽

Martin Guthold

Keyword(s):

Atomic Force Microscopy ◽

Direct Method ◽

Lateral Force ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force

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Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

Review of Scientific Instruments ◽

10.1063/1.2894209 ◽

2008 ◽

Vol 79 (3) ◽

pp. 033708 ◽

Cited By ~ 28

Author(s):

Hui Xie ◽

Julien Vitard ◽

Sinan Haliyo ◽

Stéphane Régnier ◽

Mehdi Boukallel

Keyword(s):

Atomic Force Microscopy ◽

Force Sensor ◽

Lateral Force ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force

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Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

Review of Scientific Instruments ◽

10.1063/1.2801009 ◽

2007 ◽

Vol 78 (10) ◽

pp. 103707 ◽

Cited By ~ 48

Author(s):

Ozgur Sahin

Keyword(s):

Atomic Force Microscopy ◽

Time Varying ◽

Force Measurements ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Tribological analysis of glass fibers using atomic force microscopy (AFM)/lateral force microscopy (LFM)

Journal of Applied Polymer Science ◽

10.1002/(sici)1097-4628(20000222)75:8<1013::aid-app6>3.0.co;2-y ◽

2000 ◽

Vol 75 (8) ◽

pp. 1013-1025 ◽

Cited By ~ 8

Author(s):

N. Behary ◽

A. Ghenaim ◽

A. El Achari ◽

C. Caze

Keyword(s):

Atomic Force Microscopy ◽

Glass Fibers ◽

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Tribological Analysis

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Interaction force measurements using atomic force microscopy for characterization and control of adhesion, dispersion and lubrication in particulate

Atomic Force Microscopy in Adhesion Studies ◽

10.1201/b12164-17 ◽

2005 ◽

pp. 55-56

Keyword(s):

Atomic Force Microscopy ◽

Interaction Force ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force ◽

And Control

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Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

Tribology Letters ◽

10.1007/s11249-020-01349-y ◽

2020 ◽

Vol 68 (4) ◽

Author(s):

Arnab Bhattacharjee ◽

Nikolay T. Garabedian ◽

Christopher L. Evans ◽

David L. Burris

Keyword(s):

Atomic Force Microscopy ◽

Lateral Force ◽

Force Microscopy ◽

Atomic Force ◽

Force Calibration

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Direct Force Measurements at Polymer Brush Surfaces by Atomic Force Microscopy

Macromolecules ◽

10.1021/ma971571n ◽

1998 ◽

Vol 31 (13) ◽

pp. 4297-4300 ◽

Cited By ~ 100

Author(s):

Tommie W. Kelley ◽

Phillip A. Schorr ◽

Kristin D. Johnson ◽

Matthew Tirrell ◽

C. Daniel Frisbie

Keyword(s):

Atomic Force Microscopy ◽

Polymer Brush ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force

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Bovine Serum Albumin Adhesion Force Measurements Using an Atomic Force Microscopy

Frontiers in Materials Science and Technology - Advanced Materials Research ◽

10.4028/0-87849-475-8.49 ◽

2008 ◽

pp. 49-52

Author(s):

Chun Chih Lai ◽

John M. Bell ◽

Nunzio Motta

Keyword(s):

Atomic Force Microscopy ◽

Bovine Serum Albumin ◽

Serum Albumin ◽

Bovine Serum ◽

Adhesion Force ◽

Force Measurements ◽

Force Microscopy ◽

Atomic Force

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Direct Study of C12E5Aggregation on Mica by Atomic Force Microscopy Imaging and Force Measurements

Langmuir ◽

10.1021/la000103v ◽

2000 ◽

Vol 16 (16) ◽

pp. 6641-6647 ◽

Cited By ~ 24

Author(s):

Jinping Dong ◽

Guangzhao Mao

Keyword(s):

Atomic Force Microscopy ◽

Force Measurements ◽

Microscopy Imaging ◽

Force Microscopy ◽

Direct Study ◽

Atomic Force ◽

Atomic Force Microscopy Imaging

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Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2015.10.028 ◽

2016 ◽

Vol 161 ◽

pp. 41-50 ◽

Cited By ~ 14

Author(s):

Bien Cuong Tran Khac ◽

Koo-Hyun Chung

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Assessment ◽

Lateral Force ◽

Force Microscopy ◽

Atomic Force ◽

Calibration Methods ◽

Force Calibration

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A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy

Applied Physics Letters ◽

10.1063/1.1335546 ◽

2001 ◽

Vol 78 (1) ◽

pp. 123-125 ◽

Cited By ~ 214

Author(s):

F. J. Giessibl

Keyword(s):

Atomic Force Microscopy ◽

Frequency Modulation ◽

Direct Method ◽

Frequency Shifts ◽

Force Microscopy ◽

Atomic Force ◽

A Direct Method

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