Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode

2007 ◽  
Vol 90 (19) ◽  
pp. 194104 ◽  
Author(s):  
Yasuhiro Sugawara ◽  
Naritaka Kobayashi ◽  
Masayo Kawakami ◽  
Yan Jun Li ◽  
Yoshitaka Naitoh ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Shift ◽  
Phase Modulation ◽  
Constant Amplitude ◽  
Force Microscopy ◽  
Atomic Force ◽  
Amplitude Mode

scholarly journals Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments

AIP Advances ◽  
2011 ◽  
Vol 1 (2) ◽  
pp. 022136 ◽  
Author(s):  
A. Labuda ◽  
K. Kobayashi ◽  
D. Kiracofe ◽  
K. Suzuki ◽  
P. H. Grütter ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
Force Microscopy ◽  
Atomic Force

OBSERVATION OF DIRECT-CURRENT-INDUCED STEP BENDING PATTERNS ON Si(001)

2000 ◽  
Vol 07 (05n06) ◽  
pp. 577-582 ◽  
Author(s):  
J.-F. NIELSEN ◽  
J. P. PELZ ◽  
M. S. PETTERSEN
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Shift ◽  
Optical Microscopy ◽  
Direct Current ◽  
Applied Current ◽  
Force Microscopy ◽  
Atomic Force ◽  
Theoretical Predictions ◽  
Step Density

Atomic force microscopy and optical microscopy were used to observe a novel "step bending" instability on vicinal Si(001) surfaces heated with direct current along a <110> direction. This instability occurs on areas where the applied current is parallel to the average step direction and consists of wavy step undulations with a nonzero phase shift between adjacent steps, consistent with theoretical predictions by Liu et al. [Phys. Rev. Lett.81, 2743 (1998)]. The resulting "bands" of high step density run obliquely to the direction of the applied current. These step patterns were observed on spherically dimpled surfaces, which also exhibit a variety of other electromigration-induced instabilities.

Multifrequency high-speed phase-modulation atomic force microscopy in liquids

2010 ◽  
Vol 110 (6) ◽  
pp. 582-585 ◽  
Author(s):  
Yan Jun Li ◽  
Kouhei Takahashi ◽  
Naritaka Kobayashi ◽  
Yoshitaka Naitoh ◽  
Masami Kageshima ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Modulation ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force
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