Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage

Hikaru Nomura; Kenichiro Kawasaki; Takuma Chikamoto; Yan Jun Li; Yoshitaka Naitoh; Masami Kageshima; Yasuhiro Sugawara

doi:10.1063/1.2432281

Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage

Applied Physics Letters ◽

10.1063/1.2432281 ◽

2007 ◽

Vol 90 (3) ◽

pp. 033118 ◽

Cited By ~ 5

Author(s):

Hikaru Nomura ◽

Kenichiro Kawasaki ◽

Takuma Chikamoto ◽

Yan Jun Li ◽

Yoshitaka Naitoh ◽

...

Keyword(s):

Bias Voltage ◽

Dissipative Force ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Force Modulation

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Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation

Physical Review Applied ◽

10.1103/physrevapplied.4.054011 ◽

2015 ◽

Vol 4 (5) ◽

Cited By ~ 16

Author(s):

Yoichi Miyahara ◽

Jessica Topple ◽

Zeno Schumacher ◽

Peter Grutter

Keyword(s):

Electrostatic Force ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Force Modulation

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Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation

Applied Physics Letters ◽

10.1063/1.4981937 ◽

2017 ◽

Vol 110 (16) ◽

pp. 163103 ◽

Cited By ~ 12

Author(s):

Yoichi Miyahara ◽

Peter Grutter

Keyword(s):

Electrostatic Force ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Force Modulation

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Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

Nanotechnology ◽

10.1088/0957-4484/26/19/195701 ◽

2015 ◽

Vol 26 (19) ◽

pp. 195701 ◽

Cited By ~ 14

Author(s):

Lili Kou ◽

Zongmin Ma ◽

Yan Jun Li ◽

Yoshitaka Naitoh ◽

Masaharu Komiyama ◽

...

Keyword(s):

Surface Potential ◽

Bias Voltage ◽

Frequency Modulation ◽

Kelvin Probe Force Microscopy ◽

Atomic Resolution ◽

Kelvin Probe ◽

Force Microscopy ◽

Voltage Feedback

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Kelvin Probe Force Microscopy without Bias-Voltage Feedback

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.5626 ◽

2007 ◽

Vol 46 (8B) ◽

pp. 5626-5630 ◽

Cited By ~ 33

Author(s):

Osamu Takeuchi ◽

Yoshihisa Ohrai ◽

Shoji Yoshida ◽

Hidemi Shigekawa

Keyword(s):

Bias Voltage ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Voltage Feedback

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Cited By ~ 3

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Real Space ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Cited By ~ 26

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Cited By ~ 1

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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