Ion and electron bombardment-related ion emission during the analysis of diamond using secondary ion mass spectrometry

Berta Guzmán de la Mata; Mark G. Dowsett

doi:10.1063/1.2430623

Ion and electron bombardment-related ion emission during the analysis of diamond using secondary ion mass spectrometry

Journal of Applied Physics ◽

10.1063/1.2430623 ◽

2007 ◽

Vol 101 (3) ◽

pp. 034910 ◽

Cited By ~ 3

Author(s):

Berta Guzmán de la Mata ◽

Mark G. Dowsett

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Electron Bombardment ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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Secondary ion mass spectrometry: Polyatomic and molecular ion emission

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(86)90513-6 ◽

1986 ◽

Vol 13 (1-3) ◽

pp. 259-277 ◽

Cited By ~ 11

Author(s):

Richard J. Colton ◽

Mark M. Ross ◽

David A. Kidwell

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Molecular Ion ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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Decision letter for "A statistical model of secondary ion emission and attenuation clarifies disparities in quasi‐simultaneous arrival (QSA) coefficients measured with Secondary Ion Mass Spectrometry"

10.1002/rcm.8958/v1/decision1 ◽

2020 ◽

Keyword(s):

Mass Spectrometry ◽

Statistical Model ◽

Secondary Ion Mass Spectrometry ◽

Secondary Ion Emission ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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A statistical model of secondary ion emission and attenuation clarifies disparities in quasi‐simultaneous arrival coefficients measured with secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8958 ◽

2020 ◽

Vol 35 (1) ◽

Author(s):

Clive Jones ◽

David A. Fike

Keyword(s):

Mass Spectrometry ◽

Statistical Model ◽

Secondary Ion Mass Spectrometry ◽

Secondary Ion Emission ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies

International Journal of Mass Spectrometry ◽

10.1016/j.ijms.2007.09.018 ◽

2008 ◽

Vol 269 (1-2) ◽

pp. 112-117 ◽

Cited By ~ 17

Author(s):

Zhen Li ◽

Stanislav V. Verkhoturov ◽

Jay E. Locklear ◽

Emile A. Schweikert

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Secondary Ion Emission ◽

Ion Mass Spectrometry ◽

Multilayer Assemblies ◽

Ion Emission ◽

Secondary Ion

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On the bond breaking model of polyatomic ion emission in secondary ion mass spectrometry

Surface Science ◽

10.1016/0039-6028(82)90042-5 ◽

1982 ◽

Vol 121 (2) ◽

pp. 260-274 ◽

Cited By ~ 21

Author(s):

B.I. Dunlap

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Bond Breaking ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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On the bond breaking model of polyatomic ion emission in secondary ion mass spectrometry

Surface Science Letters ◽

10.1016/0167-2584(82)90726-5 ◽

1982 ◽

Vol 121 (2) ◽

pp. A371

Author(s):

B.I. Dunlap

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Bond Breaking ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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Secondary ion emission enhancement assisted by electron beam in secondary ion mass spectrometry

International Journal of Mass Spectrometry ◽

10.1016/j.ijms.2008.04.016 ◽

2008 ◽

Vol 274 (1-3) ◽

pp. 25-29 ◽

Cited By ~ 2

Author(s):

Wei-Chiang Lee ◽

J. Hwang

Keyword(s):

Mass Spectrometry ◽

Electron Beam ◽

Secondary Ion Mass Spectrometry ◽

Secondary Ion Emission ◽

Emission Enhancement ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Secondary Ion

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Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry

International Journal of Mass Spectrometry and Ion Physics ◽

10.1016/0020-7381(81)80016-2 ◽

1981 ◽

Vol 38 (1) ◽

pp. 21-33 ◽

Cited By ~ 20

Author(s):

C.-E. Richter ◽

M. Trapp

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Ion Emission ◽

Secondary Ion

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Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry

International Journal of Mass Spectrometry and Ion Physics ◽

10.1016/0020-7381(81)85009-7 ◽

1981 ◽

Vol 40 (1) ◽

pp. 87-100 ◽

Cited By ~ 4

Author(s):

C.-E. Richter ◽

M. Trapp

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Ion Emission ◽

Secondary Ion

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Secondary ion mass spectrometry without secondary ion emission. Recombinative scattering of hyperthermal Cs+ ions from a Si(111) surface adsorbed with water

The Journal of Chemical Physics ◽

10.1063/1.470602 ◽

1995 ◽

Vol 103 (12) ◽

pp. 5149-5152 ◽

Cited By ~ 19

Author(s):

M. C. Yang ◽

H. W. Lee ◽

H. Kang

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Secondary Ion Emission ◽

Ion Mass Spectrometry ◽

Ion Emission ◽

Cs Ions ◽

Secondary Ion

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