Thermally stimulated current studies on deep levels in hydrothermally grown single crystal ZnO bulk

2006 ◽  
Vol 89 (24) ◽  
pp. 242113 ◽  
Author(s):  
K. Kuriyama ◽  
M. Ooi ◽  
K. Matsumoto ◽  
K. Kushida
Keyword(s):  
Single Crystal ◽  
Deep Levels ◽  
Thermally Stimulated Current ◽  
Grown Single Crystal

Optical and structural properties of CVD-grown single crystal SiO2 using optically detected XAS

2005 ◽  
Vol 244 (1-4) ◽  
pp. 318-321 ◽  
Author(s):  
T. Nakamura ◽  
N. Takahashi ◽  
N.R.J. Poolton ◽  
A.E.R. Malins
Keyword(s):  
Single Crystal ◽  
Structural Properties ◽  
Optically Detected ◽  
Grown Single Crystal

scholarly journals Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction

2020 ◽  
Vol 53 (1) ◽  
pp. 99-106
Author(s):  
Andreas Johannes ◽  
Jura Rensberg ◽  
Tilman A. Grünewald ◽  
Philipp Schöppe ◽  
Maurizio Ritzer ◽  
...  
Keyword(s):  
Surface Tension ◽  
Single Crystal ◽  
Spatial Resolution ◽  
Deformation Tensor ◽  
X Ray Diffraction ◽  
Projected Area ◽  
Absolute Value ◽  
X Ray ◽  
Grown Single Crystal

This work showcases a method to map the full deformation tensor in a single micro-sized crystal. It is shown that measuring the position of two Bragg reflections in reciprocal space is sufficient to obtain the full deformation tensor, if the condition of incompressibility of the material is imposed. This method is used to reveal the surface tension induced deformation at the edges of an as-grown single-crystal VO2 microwire. All components of the deformation tensor of the microwire were measured down to an absolute value of 10−4 in an 8 × 14 µm projected area of the wire. With a beam-defined spatial resolution of 150 × 150 nm, the measurement time was merely 2.5 h.

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