Grazing Incidence angle X-ray Diffraction of implanted stainless steel: comparison between simulated data and experimental data

2006 ◽  
Author(s):  
J. Dudognon ◽  
M. Vayer ◽  
A. Pineau ◽  
R. Erre
Keyword(s):  
Experimental Data ◽  
Stainless Steel ◽  
Incidence Angle ◽  
Simulated Data ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grazing Incidence Angle

Generalized grazing-incidence-angle X-ray diffraction (G-GIXD) using image plates

1998 ◽  
Vol 5 (3) ◽  
pp. 488-490 ◽  
Author(s):  
Yasuo Takagi ◽  
Masao Kimura
Keyword(s):  
Incidence Angle ◽  
Incident Beam ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface And Interface ◽  
Out Of Plane ◽  
Grazing Incidence Angle ◽  
Interface Layers

A new and more `generalized' grazing-incidence-angle X-ray diffraction (G-GIXD) method which enables simultaneous measurements both of in- and out-of-plane diffraction images from surface and interface structures has been developed. While the method uses grazing-incidence-angle X-rays like synchrotron radiation as an incident beam in the same manner as in `traditional' GIXD, two-dimensional (area) detectors like image plates and a spherical-type goniometer are used as the data-collection system. In this way, diffraction images both in the Seemann–Bohlin (out-of-plane) and GIXD geometry (in-plane) can be measured simultaneously without scanning the detectors. The method can be applied not only to the analysis of the in-plane crystal structure of epitaxically grown thin films, but also to more general research topics like the structural analysis of polycrystalline mixed phases of thin surface and interface layers.

Generalized Grazing Incidence-Angle X-Ray Diffraction Studies on InAs Quantum Dots on Si (100) Substrates

2000 ◽  
Vol 39 (Part 1, No. 7B) ◽  
pp. 4483-4485 ◽  
Author(s):  
Takeshi Uragami ◽  
Hiroshi Fujioka ◽  
Ichitaro Waki ◽  
Takaaki Mano ◽  
Kanta Ono ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Incidence Angle ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Inas Quantum Dots ◽  
X Ray ◽  
Grazing Incidence Angle

X-ray diffraction with a four-reflection monochromator

1987 ◽  
Vol 20 (6) ◽  
pp. 522-528 ◽  
Author(s):  
S. E. G. Slusky ◽  
A. T. Macrander
Keyword(s):  
Experimental Data ◽  
Indium Phosphide ◽  
Single Crystal ◽  
Simulated Data ◽  
Vertical Gradient ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Vertical Gradient Freeze

A formula is derived for simulating rocking-curve measurements made with an X-ray diffractometer fitted with a four-reflection monochromator. The derivation is carried out both graphically and algebraically. Results of a simulation using this formula are then compared with experimentally obtained rocking curves. The rocking curves were obtained using a diffractometer with a four-reflection monochromator that uses 440 reflections from two channel-cut germanium crystals. The experimental data comprise 200, 400, 600, 511, 711, 622, 422 and 444 reflections from thick single-crystal indium phosphide grown by the vertical-gradient freeze technique. The simulated data correlate well with the experimental data, although the simulations consistently show somewhat higher reflectivities and narrower linewidths than the experiment, indicating the existence of broadening mechanisms not included in the simulation that are affecting the experiment.

Modelling of grazing incidence X-ray diffraction spectra from Mo-implanted stainless steel

2006 ◽  
Vol 200 (16-17) ◽  
pp. 5058-5066 ◽  
Author(s):  
J. Dudognon ◽  
M. Vayer ◽  
A. Pineau ◽  
R. Erre
Keyword(s):  
Stainless Steel ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

A Precision Grazing-incidence Angle Error Measurement of a Hard X-ray Condenser Mirror Using Single-grating Interferometry

2013 ◽  
Vol 26 (5) ◽  
pp. 13-16 ◽  
Author(s):  
Ryosuke Fukui ◽  
Jangwoo Kim ◽  
Satoshi Matsuyama ◽  
Hirokatsu Yumoto ◽  
Yuichi Inubushi ◽  
...  
Keyword(s):  
Incidence Angle ◽  
Grazing Incidence ◽  
Error Measurement ◽  
Angle Error ◽  
X Ray ◽  
Grazing Incidence Angle

Structural Characterization of GaN Epilayers Grown on Patterned Sapphire Substrates

2005 ◽  
Vol 864 ◽  
Author(s):  
Chang-Soo Kim ◽  
Ji-Hyun Moon ◽  
Sang-Jun Lee ◽  
Sam-Kyu Noh ◽  
Je Won Kim ◽  
...  
Keyword(s):  
Incidence Angle ◽  
Surface Region ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Patterned Substrate ◽  
Sapphire Substrates ◽  
Patterned Sapphire Substrates

AbstractThe structural properties of GaN epitaxial layers grown on patterned sapphire substrates by MOCVD have been investigated using HRXRD(high-resolution X-ray diffraction), GIXRD(grazing incidence X-ray diffraction) and PL(photoluminescence). For X-ray characterizations rocking curves for GaN (10·5), (00·2), (11·4) and (11·0) reflections for which incidence angles of X-rays are 32.0°, 17.3°, 11.0° and 0.34°, respectively, were measured. For (10·5), (00·2) and (11·4) reflections FWHMs of the rocking curves for a patterned substrate were broader than those for a unpatterned substrate, for (11·0) reflection, however, FWHM for a patterned substrate was much narrower than that for a unpatterned substrate. The normalized FWHM for all reflections decreases as the incidence angle of X-ray decreases. The results indicate that the crystalline quality in the surface region of the epilayer on a patterned substrate was especially improved because the penetration depth of X-ray depends on the incidence angle. The intensity of PL peak of the epilayer for a patterned substrate increased compared to that for a unpatterned substrate, and the increase in PL intensity is attributed to the reduction in dislocation density at the surface region revealed the by X-ray results.

scholarly journals Multireflection grazing-incidence X-ray diffraction: a new approach to experimental data analysis

2019 ◽  
Vol 52 (6) ◽  
pp. 1409-1421 ◽  
Author(s):  
Marianna Marciszko-Wiąckowska ◽  
Adrian Oponowicz ◽  
Andrzej Baczmański ◽  
Miroslaw Wróbel ◽  
Ch. Braham ◽  
...  
Keyword(s):  
Experimental Data ◽  
Linear Regression ◽  
Diffraction Method ◽  
Grazing Incidence ◽  
Lattice Parameter ◽  
Test Surface ◽  
Shear Stresses ◽  
Simple Linear Regression ◽  
X Ray Diffraction ◽  
X Ray

The multireflection grazing-incidence X-ray diffraction method is used to test surface stresses at depths of several micrometres in the case of metal samples. This work presents new ways of analysing experimental data obtained by this method for Ni samples exhibiting significant elastic anisotropy of crystals. Three different methods of determining biaxial stresses and lattice parameter were compared. In the first approach, the calculations were performed using the linear least-squares method, and then two simplified procedures based on simple linear regression (weighted and non-weighted) were applied. It was found that all the tested methods give similar results, i.e. almost equal values of the determined stresses and lattice parameters and the uncertainties of their determination. The advantage of analyses based on simple linear regression is their simplicity and straightforward interpretation, enabling easy verification of the influence of the crystallographic texture and the presence of shear stresses, as well as graphical determination of the stress-free lattice parameter.

X-ray diffraction grazing-incidence methods applied for gradient-free residual stress profile measurements in electrodeposited Ni coatings

2015 ◽  
Vol 48 (1) ◽  
pp. 71-78 ◽  
Author(s):  
Bogusz Kania ◽  
Paulina Indyka ◽  
Leszek Tarkowski ◽  
Ewa Beltowska-Lehman
Keyword(s):  
Residual Stress ◽  
Incidence Angle ◽  
Grazing Incidence ◽  
Stress Profile ◽  
Angle Of Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Stress Profile ◽  
Constant Angle ◽  
Graded Material

The present work investigates the possibility of bias introduced in grazing-incidence-angle X-ray diffraction techniques applied to residual stress measurements. In these studies, monotextured nanocrystalline nickel coatings obtained by electrodeposition were examined as the model reference samples. Selected Ni coatings exhibited well developed and simple gradient-free residual stress states that were visible using conventional sin2ψ measurements with varying X-ray penetration depths. These results were verified against the stress state picture obtained by two variants of grazing-incidence X-ray methods: multi-reflection (differenthkl) and constant angle of incidence (singlehkl). The outcome of both grazing techniques consistently excluded stress gradients in the samples, which agreed with conventional sin2ψ measurement results. However, only the results of the constant angle of incidence technique agreed with those obtained by the sin2ψ method in terms of calculated residual stress level, suggesting this approach could be applied in further studies of graded material coatings. All analysed coatings yielded uniformly distributed tensile residual stress related to gradual structure development in electrodeposited Ni coatings studied by electron microscopy techniques.

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