Electrical and noise characterization of bottom-gated nanocrystalline silicon thin-film transistors
Keyword(s):
Keyword(s):
2009 ◽
Vol 54
(9(5))
◽
pp. 437-440
◽
Keyword(s):
2007 ◽
Vol 51
(5)
◽
pp. 726-731
◽
Keyword(s):
2012 ◽
Vol 43
(1)
◽
pp. 1133-1136
◽
2004 ◽
Vol 43
(2)
◽
pp. 477-484
◽
Keyword(s):