Angle dependent surface enhanced Raman scattering obtained from a Ag nanorod array substrate

2006 ◽  
Vol 89 (17) ◽  
pp. 173134 ◽  
Author(s):  
Yongjun Liu ◽  
Jianguo Fan ◽  
Y.-P. Zhao ◽  
Saratchandra Shanmukh ◽  
Richard A. Dluhy
2016 ◽  
Vol 32 (4) ◽  
pp. 1036-1042 ◽  
Author(s):  
Xiang-Xiang FAN ◽  
◽  
Xiu-Li HE ◽  
Jian-Ping LI ◽  
Xiao-Guang GAO ◽  
...  

2020 ◽  
Author(s):  
Samir Kumar ◽  
Kouta Tokunaga ◽  
Kyoko Namura ◽  
Takao Fukuoka ◽  
Motofumi Suzuki

The surface-enhanced Raman scattering (SERS) electromagnetic (EM) enhancement mechanism is a two-fold enhancement process in which both the incident and scattered Raman fields are enhanced. In this letter, we present new direct evidence of the two-fold EM mechanism by using an Ag nanorod array/SiO<sub>2</sub> dielectric layer/Ag mirror multilayer thin film "local plasmon resonator". The two-fold EM enhancement mechanism of SERS was confirmed by analyzing the optical absorption and Raman scattering spectra of the local plasmon resonator for excitation and scattered light. The effect of light interference was altered by varying the film thickness of the SiO<sub>2</sub> phase control layer (PCL), and the absorbance in the Raman scattering wavelength range was reduced from 90% to 0%. We also demonstrated that the intensity of the background emission is closely related to the enhancement of the scattered field and provides substantial evidence for a two-fold SERS enhancement mechanism.


2009 ◽  
Vol 63 (10) ◽  
pp. 1101-1106 ◽  
Author(s):  
Nicole E. Marotta ◽  
Jabulani R. Barber ◽  
Peter R. Dluhy ◽  
Lawrence A. Bottomley

Sensors ◽  
2019 ◽  
Vol 19 (21) ◽  
pp. 4765
Author(s):  
Yi-Jun Jen ◽  
Meng-Jie Lin ◽  
Hou-Lon Cheang ◽  
Teh-Li Chan

In this work, titanium nitride (TiN) nanorod arrays were prepared as surface-enhanced Raman scattering (SERS) substrates using glancing angle deposition (GLAD) in a magnetron sputtering system. The nitrogen flow rate was varied from RN2 = 1 to 3 sccm, yielding five TiN uniform thin films and five TiN nanorod arrays. The figure of merit (FOM) of each TiN uniform film was measured and compared with the SERS signal of each TiN nanorod array. Rhodamine 6G (R6G) was used as the analyte in SERS measurement. For an R6G concentration of 10−6 M, the analytical enhancement factor (AEF) of the TiN nanorod array that was prepared at RN2 = 1.5 sccm was 104. The time-durable SERS performance of TiN nanorod arrays was also investigated.


2020 ◽  
Author(s):  
Samir Kumar ◽  
Kouta Tokunaga ◽  
Kyoko Namura ◽  
Takao Fukuoka ◽  
Motofumi Suzuki

The surface-enhanced Raman scattering (SERS) electromagnetic (EM) enhancement mechanism is a two-fold enhancement process in which both the incident and scattered Raman fields are enhanced. In this letter, we present new direct evidence of the two-fold EM mechanism by using an Ag nanorod array/SiO<sub>2</sub> dielectric layer/Ag mirror multilayer thin film "local plasmon resonator". The two-fold EM enhancement mechanism of SERS was confirmed by analyzing the optical absorption and Raman scattering spectra of the local plasmon resonator for excitation and scattered light. The effect of light interference was altered by varying the film thickness of the SiO<sub>2</sub> phase control layer (PCL), and the absorbance in the Raman scattering wavelength range was reduced from 90% to 0%. We also demonstrated that the intensity of the background emission is closely related to the enhancement of the scattered field and provides substantial evidence for a two-fold SERS enhancement mechanism.


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