Combined effect of a single grain boundary and artificial pinning centers on the critical current density in a YBa2Cu3O7−δ thin film

2006 ◽  
Vol 89 (17) ◽  
pp. 172505 ◽  
Author(s):  
T. Horide ◽  
K. Matsumoto ◽  
Y. Yoshida ◽  
M. Mukaida ◽  
A. Ichinose ◽  
...  
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Combined Effect ◽  
Pinning Centers ◽  
Artificial Pinning Centers ◽  
Single Grain

scholarly journals Increased critical current density in Nb–Ti wires having Nb artificial pinning centers

1997 ◽  
Vol 70 (7) ◽  
pp. 901-903 ◽  
Author(s):  
R. W. Heussner ◽  
J. D. Marquardt ◽  
P. J. Lee ◽  
D. C. Larbalestier
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Pinning Centers ◽  
Artificial Pinning Centers

Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

1991 ◽  
Vol 49 ◽  
pp. 1080-1081
Author(s):  
P. Lu ◽  
W. Huang ◽  
C.S. Chern ◽  
Y.Q. Li ◽  
J. Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Film Growth ◽  
Chemical Vapor ◽  
Microstructural Characterization ◽  
Ion Milling ◽  
Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

Estimation of Local Current Transport Properties in Thin Film Superconductor Based on Scanning Hall-probe Microscopy

2012 ◽  
Vol 1434 ◽  
Author(s):  
Kohei Higashikawa ◽  
Kei Shiohara ◽  
Masayoshi Inoue ◽  
Takanobu Kiss ◽  
Masateru Yoshizumi ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Film ◽  
Critical Current Density ◽  
Electric Field ◽  
Critical Current ◽  
Current Density ◽  
Limiting Factors ◽  
Hall Probe ◽  
Scanning Hall Probe Microscopy ◽  
Field Criterion

ABSTRACTTo enhance a global critical current in a superconductor, it is indispensable to understand current limiting factors and their influence on such a critical current. From this point of view, we have investigated in-plane distribution of local critical current density and its electric field criterion in a thin-film superconductor by using scanning-Hall probe microscopy. In a remanent state, after the application of sufficiently high magnetic field to a sample, current flows at critical current density according to the critical state model. Such distribution of current density was estimated from that of measured magnetic field using the Biot-Savart law. Furthermore, the corresponding electric field criterion was evaluated from the relaxation of such remanent magnetic field by considering Faraday’s law. This means that we could estimate in-plane distribution of local critical current density as a function of electric field criterion in a nondestructive manner. This characterization method would be very helpful for finding current limiting factors in a thin-film superconductor and their influence on its global current density versus electric field properties which would usually be obtained by four-probe method.

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