Characterization of indium tin oxide surfaces and interfaces using low intensity x-ray photoemission spectroscopy

2006 ◽  
Vol 100 (9) ◽  
pp. 093719 ◽  
Author(s):  
Y. Yi ◽  
J. E. Lyon ◽  
M. M. Beerbom ◽  
R. Schlaf
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Photoemission Spectroscopy ◽  
Oxide Surfaces ◽  
X Ray ◽  
Low Intensity ◽  
Surfaces And Interfaces

Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces

2010 ◽  
Vol 131 (1-3) ◽  
pp. 401-406 ◽  
Author(s):  
Sezin Galioğlu ◽  
Mariam N. Ismail ◽  
Juliusz Warzywoda ◽  
Albert Sacco ◽  
Burcu Akata
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Microstructural Characterization ◽  
Oxide Surfaces

Preparation and Characterization of Cubic and Rod-Shaped Indium Tin Oxide Powders Using the Hydrothermal Process

2013 ◽  
Vol 311 ◽  
pp. 430-434
Author(s):  
Kuo Chin Hsu ◽  
Jiunn Der Liao ◽  
Zheng Zhong Xie ◽  
Yaw Shyan Fu
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Energy Dispersive Spectrometry ◽  
Hydrothermal Process ◽  
Xrd Analysis ◽  
Powder Size ◽  
X Ray ◽  
Thermogravimetric Analyzer ◽  
Oxide Powders

The cubic and rod-shaped powders of indium tin oxide were synthesized at a stable temperature reaction for 18h using the surfactant aid hydrothermal method under various conditions. The cubic and rod-shaped powder size changes with the concentration of the precursor. The finished products of indium tin oxide can be obtained by calcination at 500°C for 2h in air. Characterization was conducted using scanning electron microscopy (SEM), energy dispersive spectrometry (EDS), X-ray diffractometry (XRD), thermogravimetric analyzer/differential thermal analysis (TG/DTA) and the Brunauer-Emmett-Teller (BET). XRD analysis shows that the conditions of this experiment can produce pure ITO powders. The characterization of cubic and rod-shaped ITO powders is also discussed.

Characterization of indium tin oxide surfaces after KOH and HCl treatments

2008 ◽  
Vol 9 (2) ◽  
pp. 253-261 ◽  
Author(s):  
S. Gardonio ◽  
L. Gregoratti ◽  
D. Scaini ◽  
C. Castellarin-Cudia ◽  
P. Dudin ◽  
...  
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Oxide Surfaces

Preparation and Characterization of Cubic and Rod-Shaped Indium Tin Oxide Powders Using the Hydrothermal Process

2013 ◽  
Vol 479-480 ◽  
pp. 64-68 ◽  
Author(s):  
Kuo Chin Hsu ◽  
Jiunn Der Liao ◽  
Zheng Zhong Xie ◽  
Yaw Shyan Fu
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Energy Dispersive Spectrometry ◽  
Hydrothermal Process ◽  
Xrd Analysis ◽  
Powder Size ◽  
X Ray ◽  
Thermogravimetric Analyzer ◽  
Oxide Powders

The cubic and rod-shaped powders of indium tin oxide were synthesized at a stable temperature reaction for 18h using the surfactant aid hydrothermal method under various conditions. The cubic and rod-shaped powder size changes with the concentration of the precursor. The finished products of indium tin oxide can be obtained by calcination at 500°C for 2h in air. Characterization was conducted using scanning electron microscopy (SEM), energy dispersive spectrometry (EDS), X-ray diffractometry (XRD), thermogravimetric analyzer/differential thermal analysis (TG/DTA) and the Brunauer-Emmett-Teller (BET). XRD analysis shows that the conditions of this experiment can produce pure ITO powders. The characterization of cubic and rod-shaped ITO powders is also discussed.

Fundamentals of X-Ray Photoemission Spectroscopy

MRS Bulletin ◽  
1987 ◽  
Vol 12 (6) ◽  
pp. 60-64 ◽  
Author(s):  
F.J. Grunthaner
Keyword(s):  
Materials Science ◽  
Electronic Materials ◽  
Electronic Devices ◽  
Photoemission Spectroscopy ◽  
Microelectronic Device ◽  
X Ray ◽  
Surfaces And Interfaces ◽  
Manufacturing Process Control ◽  
Silicon Based

AbstractRapid progress in the development of new electronic materials and the steady maturation of silicon-based technologies has resulted in a host of novel electronic devices in which the active region of the structure is confined to an interface or a surface. The chemical, electronic, and physical characterization of surfaces and interfaces in semiconductors and insulators is of critical importance to manufacturing process control as well as to the fundamental electron physics and materials science which support microelectronic device research.

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