Accurate dependence of gallium nitride thermal conductivity on dislocation density

2006 ◽  
Vol 89 (9) ◽  
pp. 092123 ◽  
Author(s):  
C. Mion ◽  
J. F. Muth ◽  
E. A. Preble ◽  
D. Hanser
2001 ◽  
Vol 680 ◽  
Author(s):  
J. Carlos Rojo ◽  
Leo J. Schowalter ◽  
Kenneth Morgan ◽  
Doru I. Florescu ◽  
Fred H. Pollak ◽  
...  

ABSTRACTLarge (15mm diameter) single-crystal AlN boules have been prepared using sublimationrecondensation growth. X-ray topography shows that the dislocation density averages less than 103 cm2 in some of the substrates but also that the dislocations are not uniformly distributed. Also, strain due to the differential expansion with the crucible walls seems to cause severe cracking in the periphery of the crystal and high-strain regions. Thermal analysis using the Scanning Thermal Microscopy (SThM) reveals a thermal conductivity of 3.4 ± 0.2 W/K-cm, which is the largest value ever reported for AlN.


2007 ◽  
Vol 48 (10) ◽  
pp. 2782-2786 ◽  
Author(s):  
Hiroyuki Shibata ◽  
Yoshio Waseda ◽  
Hiromichi Ohta ◽  
Kazumasa Kiyomi ◽  
Kenji Shimoyama ◽  
...  

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Xufei Wu ◽  
Jonghoon Lee ◽  
Vikas Varshney ◽  
Jennifer L. Wohlwend ◽  
Ajit K. Roy ◽  
...  

2020 ◽  
Author(s):  
Jin Wu

High-quality GaN films were grown on AlN/c-sapphire templates by MOVPE with Hall mobility of 802 cm2/V.s and carrier concentration of 8.1x1016/cm3 at 300K have achieved. The film low dislocation density of 5x107 cm-2 and X-ray rocking curve FWHM of 101 and 250 arcsec for the (0004) and (20-24) reflections were also obtained, respectively.


2021 ◽  
Vol 5 (10) ◽  
Author(s):  
Yee Rui Koh ◽  
Md Shafkat Bin Hoque ◽  
Habib Ahmad ◽  
David H. Olson ◽  
Zeyu Liu ◽  
...  

2006 ◽  
Vol 40 (4-6) ◽  
pp. 338-342 ◽  
Author(s):  
C. Mion ◽  
J.F. Muth ◽  
Edward A. Preble ◽  
Drew Hanser

Sign in / Sign up

Export Citation Format

Share Document