Temperature dependence of the electrical activity of localized defects in InGaN-based light emitting diodes

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Author(s):  
M. Pavesi ◽  
M. Manfredi ◽  
F. Rossi ◽  
M. Meneghini ◽  
E. Zanoni ◽  
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Vol 52 (9-10) ◽  
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Author(s):  
T. Nshanian ◽  
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1999 ◽  
Vol 74 (24) ◽  
pp. 3598-3600 ◽  
Author(s):  
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2009 ◽  
Vol 40 (1) ◽  
pp. 1677 ◽  
Author(s):  
Marina E. Kondakova ◽  
Ralph H. Young ◽  
Viktor V. Jarikov ◽  
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