Instrumentation and analytical methods of an x-ray photoelectron spectroscopy–scanning tunneling microscopy surface analysis system for studying nanostructured materials
2006 ◽
Vol 77
(8)
◽
pp. 083901
◽
2003 ◽
Vol 125
(26)
◽
pp. 8059-8066
◽
2017 ◽
Vol 19
(21)
◽
pp. 14020-14029
◽
2011 ◽
Vol 115
(37)
◽
pp. 18186-18194
◽
1999 ◽
Vol 436
(1-3)
◽
pp. 121-130
◽