Simulated admittance spectroscopy measurements of high concentration deep level defects in CdTe thin-film solar cells

2006 ◽  
Vol 100 (3) ◽  
pp. 033710 ◽  
Author(s):  
Fred H. Seymour ◽  
Victor Kaydanov ◽  
Tim R. Ohno
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Deep Level ◽  
Thin Film Solar Cells ◽  
Admittance Spectroscopy ◽  
Cdte Thin Film ◽  
High Concentration

Discussion of some “trap signatures” observed by admittance spectroscopy in CdTe thin-film solar cells

2010 ◽  
Vol 108 (6) ◽  
pp. 064501 ◽  
Author(s):  
Jian V. Li ◽  
Steve W. Johnston ◽  
Xiaonan Li ◽  
David S. Albin ◽  
Timothy A. Gessert ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Thin Film Solar Cells ◽  
Admittance Spectroscopy ◽  
Cdte Thin Film

Characterization of Deep Defects in CdS/CdTe Thin Film Solar Cells Using Deep Level Transient Spectroscopy

2003 ◽  
Vol 763 ◽  
Author(s):  
Jorg Versluys ◽  
Paul Clauws
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Thin Film Solar Cells ◽  
Cdte Thin Film ◽  
Single Defect ◽  
Photovoltaic Energy Conversion ◽  
Electrical Injection ◽  
Transient Spectroscopy

AbstractThe presence of deep defect levels in thin film solar cells can highly affect the characteristics of the photovoltaic energy conversion. Therefore, knowledge of the origin and nature of these defects is desirable.Deep level transient spectroscopy (DLTS) was performed on a series of CdS/CdTe thin film solar cells which were activated in vacuum or air ambient. Temperature scans between 5 and 320K revealed semi-shallow and mid-gap majority traps. These mid-gap traps were also investigated using isothermal DLTS (region 250 to 330K) where the temperature is kept constant and the rate window is varied. This way the mid-gap traps can be characterized completely. Using electrical injection DLTS and optical DLTS minority traps could be detected. Electrical injection DLTS showed a single defect in the bulk of the air activated cells, while optical DLTS revealed the presence of defects close to the CdS/CdTe interface in both types of samples. The nature and origin of these defects are unknown.

Deep level transient spectroscopy of CdS/CdTe thin film solar cells

1997 ◽  
Vol 82 (3) ◽  
pp. 1423-1426 ◽  
Author(s):  
M. A. Lourenço ◽  
Yip Kum Yew ◽  
K. P. Homewood ◽  
K. Durose ◽  
H. Richter ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Thin Film Solar Cells ◽  
Cdte Thin Film ◽  
Transient Spectroscopy

scholarly journals Deep level transient spectroscopy and photoluminescence studies of CdS/CdTe thin film solar cells

2009 ◽  
Vol 58 (3) ◽  
pp. 1987
Author(s):  
Li Bing ◽  
Liu Cai ◽  
Feng Liang-Huan ◽  
Zhang Jing-Quan ◽  
Zheng Jia-Gui ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Thin Film Solar Cells ◽  
Cdte Thin Film ◽  
Transient Spectroscopy ◽  
Photoluminescence Studies

Admittance spectroscopy characterize graphite paste for back contact of CdTe thin film solar cells

2010 ◽  
Vol 53 (9) ◽  
pp. 2337-2341 ◽  
Author(s):  
XuLin He ◽  
JingQuan Zhang ◽  
LiangHuan Feng ◽  
LiLi Wu ◽  
Wei Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Thin Film Solar Cells ◽  
Admittance Spectroscopy ◽  
Back Contact ◽  
Cdte Thin Film
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