Probing the electronic structure of UO+ with high-resolution photoelectron spectroscopy

2006 ◽  
Vol 125 (13) ◽  
pp. 133202 ◽  
Author(s):  
Vasiliy Goncharov ◽  
Leonid A. Kaledin ◽  
Michael C. Heaven
2006 ◽  
Vol 328 (1-3) ◽  
pp. 183-189 ◽  
Author(s):  
C. Motch ◽  
A. Giuliani ◽  
J. Delwiche ◽  
P. Limão-Vieira ◽  
N.J. Mason ◽  
...  

2003 ◽  
Vol 802 ◽  
Author(s):  
M. Butterfield ◽  
T. Durakiewicz ◽  
E. Guziewicz ◽  
J. J. Joyce ◽  
D. P. Moore ◽  
...  

AbstractHigh resolution photoelectron spectroscopy (PES) studies were conducted on a δ-phase Plutonium sample cleaned by laser ablation and gas dosed with O2 and H2. The measurements were made with an instrument resolution of 60 meV and with the sample at 77 K. The PES data strongly support a model with Pu2O3 growth on the metal and then PuO2 growth on the Pu2O3 layer at this temperature. In vacuum, the PuO2 reduces to Pu2O3 at room temperature with a pressure of 6×10−11 Torr. In the case of H2 dosing the hydrogen appears to penetrate the surface and disrupt the valence band as evidenced by a drop in intensity of the peak at EF which is not accompanied by a drop in the main 5f manifold at ∼2eV.


Helium 584 Å radiation produces photoeleetron spectra from water and deuterium oxide, which show extensive vibrational fine structure. The results are discussed in terms of the electronic structure of the molecule, and the bonding characteristics of the various molecular orbitals. Water is inferred to have only three configurationally distinct ionization potentials smaller than 21.22 eV.


Author(s):  
Deniz Po Wong ◽  
Christian Schulz ◽  
Maciej Bartkowiak

PEAXIS (Photo Electron Analysis and resonant X-ray Inelastic Spectroscopy) is a dedicated endstation installed at the beamline U41-PEAXIS that offers high resolution soft X-ray spectroscopy measurements with incident photon energies ranging from 180 – 1600 eV. The endstation combines two X-ray spectroscopic techniques, X-ray photoelectron spectroscopy (XPS) and resonant inelastic soft X-ray scattering (RIXS), which are important for probing the electronic structure and local and collective excitations of solid-state materials. It features a continuous variation of scattering angle under UHV conditions for wave vector-resolved studies and a modular sample environment that allows investigation in the temperature range between 10 K and 1000 K.


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