Electrodeposited Biaxially Textured CeO2 and CeO2:Sm Buffer Layer for YBCO Superconductor Oxide Films

2006 ◽  
Author(s):  
Raghu Bhattacharya
Keyword(s):  
Buffer Layer ◽  
Oxide Films ◽  
Ybco Superconductor

Electrodeposited Biaxially Textured Buffer Layer for YBa[sub 2]Cu[sub 3]O[sub 7−δ] (YBCO) Superconductor Oxide Films

2006 ◽  
Vol 153 (5) ◽  
pp. C273 ◽  
Author(s):  
Raghu Bhattacharya ◽  
Sovannary Phok ◽  
Priscila Spagnol ◽  
Tapas Chaudhuri
Keyword(s):  
Buffer Layer ◽  
Oxide Films ◽  
Ybco Superconductor

Structure and chemical characteristics of tin oxide films prepared by reactive-ion-assisted deposition as a function of oxygen ion beam energy

2000 ◽  
Vol 15 (9) ◽  
pp. 1911-1921 ◽  
Author(s):  
Seok-Kyun Song ◽  
Daeil Kim ◽  
Steven Kim ◽  
Seok-Keun Koh ◽  
Hyung-Jin Jung ◽  
...  
Keyword(s):  
Buffer Layer ◽  
Tin Oxide ◽  
Ion Beam ◽  
Oxide Films ◽  
Chemical Properties ◽  
Average Energy ◽  
Working Pressure ◽  
Transmission Electron Microscopy Analysis ◽  
Oxygen Ion ◽  
Tin Oxide Films

Tin oxide films were deposited on amorphous SiO2/Si and Si (100) substrates by ion-assisted deposition (IAD) at various ion beam potentials (VI) at room temperature and a working pressure of 8 × 10−5 torr. The structural and chemical properties of the as-grown tin oxide films were investigated to determine the effects of the oxygen ion/atom arrival ratio (Ri). X-ray diffraction patterns indicated that the as-grown films with different average energy per atom (Eave) showed different growth directions. The as-grown films with oxygen/Sn ratio (NO/NSn) of 2.03 and 2.02 had preferred orientation of (101) and (002), respectively. In addition, the as-grown film with low Ri was amorphous. Comparison of the observed d spacings with those for standard SnO2 samples, indicated that the crystalline as-grown films had compressive and tensile stress depending on Eave. In transmission electron microscopy analysis, a buffer layer of amorphous tin oxide was observed at the interface between the substrate and the film, and the crystalline grains were grown on this buffer layer. The crystalline grains were arranged in large spherical clusters, and this shape directly affected surface roughness. Rutherford backscattering spectroscopy spectra showed that the tin oxide thin films were inhomogeneous. The density of films decreased and the porosity and oxygen trapped in the films increased with increasing Ri. The densest film had about 6% porosity.

Electrodeposited Biaxially Textured Ni Layer for YBCO Superconductor Oxide Films

2004 ◽  
Vol 7 (11) ◽  
pp. D22 ◽  
Author(s):  
Raghu Bhattacharya ◽  
Jun Chen ◽  
Priscila Spagnol ◽  
Tapas Chaudhuri
Keyword(s):  
Oxide Films ◽  
Ybco Superconductor

The Effect of Y2O3 Buffer Layer on the Magnetic Properties of Melt-Processed YBCO Superconductor

2010 ◽  
Vol 24 (5) ◽  
pp. 1397-1401 ◽  
Author(s):  
Alev Aydıner ◽  
Bakiye Çakır ◽  
Hironori Seki ◽  
Mehmet Başoğlu ◽  
Atikorn Wongsatanawarid ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Buffer Layer ◽  
Ybco Superconductor ◽  
Y2o3 Buffer Layer

Characteristics of Ce-Zr mixed oxide films as buffer layer by controlling composition

2003 ◽  
Vol 13 (2) ◽  
pp. 2665-2668 ◽  
Author(s):  
H.Y. Lee ◽  
S.I. Kim ◽  
Y.C. Lee ◽  
Y.P. Hong ◽  
K.H. Ko
Keyword(s):  
Buffer Layer ◽  
Mixed Oxide ◽  
Oxide Films

Resolving Crystallites in Zirconium Oxide Films

1969 ◽  
Vol 27 ◽  
pp. 140-141
Author(s):  
R.A. Ploc
Keyword(s):  
Electron Microscope ◽  
Inelastic Scattering ◽  
Zirconium Oxide ◽  
Oxide Films ◽  
Optic Axis ◽  
Objective Lens ◽  
Microscope Objective ◽  
Linear Optic ◽  
A Current ◽  
Microscope Objective Lens

The optic axis of an electron microscope objective lens is usually assumed to be straight and co-linear with the mechanical center. No reason exists to assume such perfection and, indeed, simple reasoning suggests that it is a complicated curve. A current centered objective lens with a non-linear optic axis when used in conjunction with other lenses, leads to serious image errors if the nature of the specimen is such as to produce intense inelastic scattering.

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