scholarly journals Electrical transport measurements on self-assembled organic molecular wires

2006 ◽  
Vol 124 (15) ◽  
pp. 154704 ◽  
Author(s):  
M. Durkut ◽  
M. Mas-Torrent ◽  
P. Hadley ◽  
P. Jonkheijm ◽  
A. P. H. J. Schenning ◽  
...  
Keyword(s):  
Electrical Transport ◽  
Molecular Wires ◽  
Transport Measurements ◽  
Self Assembled

Four-probe electrical transport measurements on individual metallic nanowires

2007 ◽  
Vol 18 (6) ◽  
pp. 065204 ◽  
Author(s):  
A S Walton ◽  
C S Allen ◽  
K Critchley ◽  
M Ł Górzny ◽  
J E McKendry ◽  
...  
Keyword(s):  
Electrical Transport ◽  
Metallic Nanowires ◽  
Transport Measurements

scholarly journals Electrical transport measurements for superconducting sulfur hydrides using boron-doped diamond electrodes on beveled diamond anvil

2020 ◽  
Vol 33 (12) ◽  
pp. 124005
Author(s):  
Ryo Matsumoto ◽  
Mari Einaga ◽  
Shintaro Adachi ◽  
Sayaka Yamamoto ◽  
Tetsuo Irifune ◽  
...  
Keyword(s):  
Electrical Transport ◽  
Diamond Electrodes ◽  
Boron Doped Diamond ◽  
Boron Doped ◽  
Transport Measurements ◽  
Diamond Anvil

scholarly journals In-situ Electrical Transport Measurements Combined with Scanning Transmission X-ray Microscopy

2018 ◽  
Vol 24 (S2) ◽  
pp. 78-79
Author(s):  
S. Finizio ◽  
K. Zeissler ◽  
G. Burnell ◽  
C.H. Marrows ◽  
J. Raabe
Keyword(s):  
Electrical Transport ◽  
X Ray ◽  
Transport Measurements ◽  
Scanning Transmission

Investigation of the graphitization process of ion-beam irradiated diamond using ellipsometry, Raman spectroscopy and electrical transport measurements

Carbon ◽  
2017 ◽  
Vol 121 ◽  
pp. 512-517 ◽  
Author(s):  
T. Lühmann ◽  
R. Wunderlich ◽  
R. Schmidt-Grund ◽  
J. Barzola-Quiquia ◽  
P. Esquinazi ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Electrical Transport ◽  
Ion Beam ◽  
Transport Measurements

Electrical transport measurements and degradation of graphene/n-Si schottky junction diodes

2015 ◽  
Vol 66 (1) ◽  
pp. 22-26 ◽  
Author(s):  
No-Won Park ◽  
Won-Yong Lee ◽  
Sang-Kwon Lee ◽  
Dong-Joo Kim ◽  
Gil-Sung Kim ◽  
...  
Keyword(s):  
Electrical Transport ◽  
Schottky Junction ◽  
Transport Measurements

Extended D.C. Electrical Transport Measurements on the Mixed Conductor Cu3Cs2

1997 ◽  
Vol 500 ◽  
Author(s):  
P. K. Lemaire ◽  
J. Benoit ◽  
R. Speel
Keyword(s):  
Ionic Conductivity ◽  
Electrical Transport ◽  
Electronic Conductivity ◽  
Ionic Transport ◽  
Mixed Conductor ◽  
Chemical Diffusion Coefficient ◽  
Mixed Conductors ◽  
Voltage Versus ◽  
Temperature Range ◽  
Transport Measurements

ABSTRACTD.C. electrical transport measurements have been done over the temperature range 200 K. to 450 K on the mixed conductor Cu3.0CS2 This work extends the original work done on CuxCS2 over the temperature range 260 K to 350 K. Above 220 K, the voltage versus time curves follow the Yokota model for mixed conductors. Below 220K, the voltage versus time curves were practically constant, suggesting very little ionic transport below this temperature, and an electronic conductivity of the order of 10−5 (Ω cm)−1 at 200 K. At ambient temperatures, the ionic conductivity and electronic conductivity were both of the order of 10−3 (Ω cm)−1, and the chemical diffusion coefficient found to be of the order of 10−6 cm2s−1, in agreement with earlier work on Cu3CS2. Above 220 K, the ionic conductivity versus temperature plots were of the Arrhenius form with an activation energy of about 0.36 eV. The jump time and residence time were estimated to be of the order of 10−12s and 10−6s respectively, confirming hopping as the mode of ionic transport. The electronic conductivity versus temperature plot confirmed thermal activation as the mode of electronic transport. The results suggest CuxCS2 to be very stable and the Yokota model, with very little modification, to be very reliable for the analysis of these mixed conductors.

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