Anisotropic Elastic Constants of Copper Thin Films: RUS/Laser and Picosecond-Laser Ultrasound

2006 ◽  
Author(s):  
N. Nakamura
Keyword(s):  
Thin Films ◽  
Elastic Constants ◽  
Picosecond Laser ◽  
Laser Ultrasound ◽  
Anisotropic Elastic

722 Study on anisotropic elastic constants of superlattice thin films by RUS/laser and picosecond ultrasounds

2006 ◽  
Vol 2006.81 (0) ◽  
pp. _7-22_
Author(s):  
Nobutomo NAKAMURA ◽  
Hirotsugu OGI ◽  
Makoto FUJII ◽  
Takeshi YASUI ◽  
Masahiko HIRAO
Keyword(s):  
Thin Films ◽  
Elastic Constants ◽  
Anisotropic Elastic

Advanced Resonant-Ultrasound Spectroscopy for Studying Anisotropic Elastic Constants of Thin Films

2005 ◽  
Vol 875 ◽  
Author(s):  
Hirotsugu Ogi ◽  
Nobutomo Nakamura ◽  
Hiroshi Tanei ◽  
Masahiko Hirao
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Film Thickness ◽  
Elastic Constants ◽  
Elastic Anisotropy ◽  
Thickness Direction ◽  
Resonant Ultrasound Spectroscopy ◽  
Out Of Plane ◽  
Resonant Ultrasound ◽  
Anisotropic Elastic

AbstractThis paper presents two advanced acoustic methods for the determination of anisotropic elastic constants of deposited thin films. They are resonant-ultrasound spectroscopy with laser-Doppler interferometry (RUS/Laser method) and picosecond-laser ultrasound method. Deposited thin films usually exhibit elastic anisotropy between the film-growth direction and an in-plane direction, and they show five independent elastic constants denoted by C11,C33,C44,C66 and C13 when the x3 axis is set along the film-thickness direction. The former method determines four moduli except C44, the out-of-plane shear modulus, through free-vibration resonance frequencies of the film/substrate specimen. This method is applicable to thin films thicker than about 200 nm. The latter determines C33, the out-of-plane modulus, accurately bymeasuring the round-trip time of the longitudinal wave traveling along the film-thickness direction. This method is applicable to thin films thicker than about 20 nm. Thus, combination of these two methods allows us to discuss the elastic anisotropy of thin films. The results for Co/Pt superlattice thin film and copper thin film are presented.

J0402-1-5 Development of Elastic-Constant Measurement in THin Films at Low Temperatures Using Picosecond Laser Ultrasound Spectroscopy

2010 ◽  
Vol 2010.6 (0) ◽  
pp. 393-394
Author(s):  
Kenichi TANIGAKI ◽  
Tatsuya KUSUMOTO ◽  
Hirotsugu OGI ◽  
Nobutomo NAKAMURA ◽  
Masahiko HIRAO
Keyword(s):  
Thin Films ◽  
Elastic Constant ◽  
Low Temperatures ◽  
Picosecond Laser ◽  
Laser Ultrasound ◽  
Constant Measurement

INVERSION OF ANISOTROPIC ELASTIC CONSTANTS AND MUD SPEED USING BOREHOLE SONIC MODES

2020 ◽  
Author(s):  
Ting Lei ◽  
◽  
Romain Prioul ◽  
Adam Donald ◽  
Edgar Ignacio Velez Arteaga ◽  
...  
Keyword(s):  
Elastic Constants ◽  
Anisotropic Elastic

Representation of the Microstructural Dependence of the Anisotropic Elastic Constants of Textured Materials

1990 ◽  
Vol 207 ◽  
Author(s):  
Stephen C. Cowin
Keyword(s):  
Elastic Constants ◽  
Material Symmetry ◽  
Hooke’S Law ◽  
Mechanical Models ◽  
Hooke's Law ◽  
Micromechanical Models ◽  
Anisotropic Elastic ◽  
Anisotropic Form ◽  
Textured Materials ◽  
Elastic Coefficients

AbstractThis paper addresses the question of representing the dependence of the elastic coefficients in the anisotropic form of Hooke's law upon the microstructure of a material. The concern is with textured material symmetries, that is to say materials such as natural and man-made composites whose material symmetry is determined by microstructural organization. The approach is to relate the anisotropic elastic coefficients to local geometric or stereological measures of the microstructure. The predictions of micromechanical models and continuum mechanical models are compared and are found to be consistent with each other.

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