In situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon
1993 ◽
Vol 68
(2)
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pp. 185-194
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2001 ◽
Vol 223
(1-2)
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pp. 161-168
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2000 ◽
Vol 211
(1-3)
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pp. 16-21
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1997 ◽
Vol 75
(6)
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pp. 1641-1663
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1999 ◽
Vol 625
(5)
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pp. 755-763
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2006 ◽
Vol 252
(23)
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pp. 8102-8106
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1997 ◽
Vol 75
(1)
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pp. 35-42
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