scholarly journals Characterization of liquid cluster ion source by the time-of-flight method

2006 ◽  
Vol 77 (3) ◽  
pp. 03B509 ◽  
Author(s):  
Gikan H. Takaoka ◽  
Hidetaka Noguchi ◽  
Kazuya Nakayama ◽  
Masakazu Kawashita
Keyword(s):  
Time Of Flight ◽  
Ion Source ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Time Of Flight Method

Multipole Ion Trap as Cluster-Ion Source

2007 ◽  
Vol 46 (7A) ◽  
pp. 4312-4317
Author(s):  
Noriyuki Uchida ◽  
Yuji Ohishi ◽  
Tomonari Sho ◽  
Kaoru Kimura ◽  
Toshihiko Kanayama
Keyword(s):  
Ion Trap ◽  
Ion Source ◽  
Cluster Ion Source ◽  
Cluster Ion

Production, Characterization, and Deposition of Carbon Clusters

1990 ◽  
Vol 206 ◽  
Author(s):  
Y. K. Bae ◽  
D. C. Lorents ◽  
R. Malhotra ◽  
C. H. Becker ◽  
D. Tse ◽  
...  
Keyword(s):  
High Temperatures ◽  
Thermal Desorption ◽  
Size Range ◽  
Ion Source ◽  
Carbon Clusters ◽  
Heating Process ◽  
Cluster Ion Source ◽  
Semiconductor Clusters ◽  
Cluster Ion ◽  
Wide Size Range

ABSTRACTWe have developed a new cluster ion source that can generate intense beams of metal and semiconductor clusters of a very wide-size range. With the source, we have observed intense beams of carbon clusters with mean cluster sizes of up to 4000 atoms/clusters. However, we have found that for generating small fullerenes, such as C60 and C70, the recently discovered technique by Kraetschmer et al. is much more efficient. By improving the technique, we have generated gram quantities of C60 and C70 and systematically investigated their thermal desorption properties. During the heating process, we have discovered that at high temperatures the bulk fullerenes, fullerite, transformed to another form of carbon, which still evaporates at temperatures above 700 C, but does not dissolve in benzene.

Vapourized-Metal Cluster Ion Source for Ion Plating

1974 ◽  
Vol 13 (S1) ◽  
pp. 427 ◽  
Author(s):  
Toshinori Takagi ◽  
Isao Yamada ◽  
Kouichi Yanagawa ◽  
Masatoshi Kunori ◽  
Shigemitsu Kobiyama
Keyword(s):  
Metal Cluster ◽  
Ion Source ◽  
Ion Plating ◽  
Cluster Ion Source ◽  
Cluster Ion

VUV-photoelectron spectroscopy on lead clusters deposited from the pulsed arc cluster ion source (PACIS)

1993 ◽  
Vol 90 (2) ◽  
pp. 201-206 ◽  
Author(s):  
H. R. Siekmann ◽  
E. Holub-Krappe ◽  
Bu. Wrenger ◽  
Ch. Pettenkofer ◽  
K. H. Meiwes-Broer
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Source ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Pulsed Arc

scholarly journals Deposition of mass-selected cluster ions using a pulsed arc cluster-ion source

2001 ◽  
Vol 73 (5) ◽  
pp. 547-554 ◽  
Author(s):  
B. Klipp ◽  
M. Grass ◽  
J. Müller ◽  
D. Stolcic ◽  
U. Lutz ◽  
...  
Keyword(s):  
Ion Source ◽  
Cluster Ions ◽  
Cluster Ion Source ◽  
Cluster Ion ◽  
Pulsed Arc

Improved tandem mass spectrometer coupled to a laser vaporization cluster ion source

2017 ◽  
Vol 88 (12) ◽  
pp. 123110 ◽  
Author(s):  
Marko Förstel ◽  
Bertram K. A. Jaeger ◽  
Wolfgang Schewe ◽  
Philipp H. A. Sporkhorst ◽  
Otto Dopfer
Keyword(s):  
Mass Spectrometer ◽  
Ion Source ◽  
Laser Vaporization ◽  
Tandem Mass ◽  
Tandem Mass Spectrometer ◽  
Cluster Ion Source ◽  
Cluster Ion

A high intensity cluster ion source for fast beam experiments

1991 ◽  
Vol 62 (5) ◽  
pp. 1157-1162 ◽  
Author(s):  
Y. K. Bae ◽  
P. C. Cosby ◽  
M. Nicholson ◽  
W. Olson
Keyword(s):  
High Intensity ◽  
Ion Source ◽  
Cluster Ion Source ◽  
Cluster Ion
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