scholarly journals Nanogaps by direct lithography for high-resolution imaging and electronic characterization of nanostructures

2006 ◽  
Vol 88 (6) ◽  
pp. 063116 ◽  
Author(s):  
Michael D. Fischbein ◽  
Marija Drndić
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
Resolution Imaging

scholarly journals Biofouling patterns in spacer filled channels: High resolution imaging for characterization of heterogeneous biofilms

2017 ◽  
Vol 80 ◽  
pp. 1-10 ◽  
Author(s):  
Marc Staal ◽  
Nadia Farhat ◽  
Mark van Loosdrecht ◽  
Johannes Vrouwenvelder
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
Resolution Imaging

scholarly journals High Resolution Imaging and Histopathological Characterization of Myocardial Infarction

2019 ◽  
Vol 116 (3) ◽  
pp. 231a ◽  
Author(s):  
Peter Lin ◽  
Jared Westreich ◽  
Mengyuan Li ◽  
Adam Gribble ◽  
Susan Newbigging ◽  
...  
Keyword(s):  
Myocardial Infarction ◽  
High Resolution ◽  
High Resolution Imaging ◽  
Resolution Imaging

Multifrequency Approaches in Characterization of Materials With Single-Pass Kelvin Force Microscopy

2010 ◽  
Author(s):  
Sergei Magonov ◽  
John D. Alexander
Keyword(s):  
High Resolution ◽  
Surface Potential ◽  
Electrostatic Force ◽  
Heterogeneous Systems ◽  
Basic Function ◽  
High Resolution Imaging ◽  
Contact Mode ◽  
Force Microscopy ◽  
Resolution Imaging

This article presents an implementation of high-resolution imaging in Kelvin force microscopy (KFM) using the multi-frequency approach in the intermittent contact mode. The basic function of atomic force microscopy – high resolution imaging of surface topography is usually performed in the resonant oscillatory modes: amplitude modulation or frequency modulation. When a conducting probe is applied in the AFM-related electric modes it senses also the electrostatic tip-sample forces. Simultaneous and separate detection of the mechanical and electrostatic forces can be realized by using the probe response at different resonant and non-resonant frequencies. In KFM, a nullification of the electrostatic force is applied for detection of a local surface potential. The described experimental set-up and procedures help us to reveal the surface potential variations with high sensitivity and spatial resolution. The examples of KFM studies of metals, semiconductors and molecular systems with dipole moments demonstrate how this technique can be applied for advanced and quantitative characterization of heterogeneous systems.

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