Temperature dependence of magnetic domain structures of single-crystal Co thin films and particles

2006 ◽  
Vol 99 (8) ◽  
pp. 08Q506 ◽  
Author(s):  
Yasuyuki Kageyama ◽  
Takao Suzuki
Author(s):  
Sonoko Tsukahara ◽  
Tadami Taoka ◽  
Hisao Nishizawa

The high voltage Lorentz microscopy was successfully used to observe changes with temperature; of domain structures and metallurgical structures in an iron film set on the hot stage combined with a goniometer. The microscope used was the JEM-1000 EM which was operated with the objective lens current cut off to eliminate the magnetic field in the specimen position. Single crystal films with an (001) plane were prepared by the epitaxial growth of evaporated iron on a cleaved (001) plane of a rocksalt substrate. They had a uniform thickness from 1000 to 7000 Å.The figure shows the temperature dependence of magnetic domain structure with its corresponding deflection pattern and metallurgical structure observed in a 4500 Å iron film. In general, with increase of temperature, the straight domain walls decrease in their width (at 400°C), curve in an iregular shape (600°C) and then vanish (790°C). The ripple structures with cross-tie walls are observed below the Curie temperature.


1997 ◽  
Vol 196 (1) ◽  
pp. 5-8 ◽  
Author(s):  
Young Min Kang ◽  
Kyeong Seok Lee ◽  
Sunggi Baik

1983 ◽  
Vol 25 ◽  
Author(s):  
J. C. Hensel ◽  
R. T. Tung ◽  
J. M. Poate ◽  
F. C. Unterwald ◽  
D. C. Jacobson

ABSTRACTTransport studies have been performed on thin films of CoSi 2 and NiSis2 in the temperature range 1 to 300 K. The conductivities are metallic with essentially the same temperature dependence; however, the residual resistivities are markedly different even though the two silicides are structurally similar (the room temperature resistivity of NiSi2 being at least twice that of CoSi2 of 15 μΩ cm). The difference is attributed to intrinsic defects in NiSi2. This defect has been simulated by ion bombardment of the film where it is also shown that Matthiesen's rule is obeyed over a remarkable range of bombardment doses.


Author(s):  
S. Tsukahara

Transmission electron microscopy, TEM, that can serve for observation of both atomic and magnetic structures is useful to investigate structure sensitive magnetic properties. It is most effective when it is applied to thin films for which direct interpretation of the results is possible without considering additional effects through specimen handling for TEM use and modification of dimension dependent magnetic properties.Transmission Lorentz microscopy, TLM, to observe magnetic domains has been known for a quarter century. Among TLM modes the defocused mode has been most popular due to its simple way of operation. Recent development of TEM made it possible that an average instrument commercially available could be easily operated at any TLM modes to produce high quality images. This paper mainly utilizes the Foucault mode to investigate domain walls and magnetization ripples as the finest details of domain structure.


2002 ◽  
Vol 738 ◽  
Author(s):  
Lucas Pérez ◽  
Oscar de Abril ◽  
Claudio Aroca ◽  
Pedro Sánchez ◽  
Eloísa López ◽  
...  

ABSTRACTThin films and arrays of lines of magnetic CoNiFe alloy have been produced by electrodeposition. A magnetic field was applied during the electrodeposition process in order to induce a magnetic anisotropy in the sample. The dependence of the magnetic properties and the magnetic domain structures on the thickness of the films is reported. In addition to this, the magnetic properties and the domain structure of a thin film and an array of lines, with the same thickness and deposited in the same conditions, have been compared. An increase in the coercivity of the array of lines has been shown.


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