Anomalous positive exchange bias in Ni80Fe20∕NixFe1−xO thin-film bilayers induced by ion-beam deposition effects
Thin‐film deposition using low‐energy ion beams (3) Mg+ ion‐beam deposition and analysis of deposits
1977 ◽
Vol 14
(2)
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pp. 695-698
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Keyword(s):
Ion Beam
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1979 ◽
Vol 16
(6)
◽
pp. 1901-1905
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