Determination of surface tension in binary mixtures using transition-matrix Monte Carlo

2006 ◽  
Vol 124 (2) ◽  
pp. 024721 ◽  
Author(s):  
Vincent K. Shen ◽  
Jeffrey R. Errington
Keyword(s):  
Surface Tension ◽  
Monte Carlo ◽  
Binary Mixtures ◽  
Transition Matrix

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

DETERMINATION OF THE TRANSITION MATRIX WITH N-COUPLED CHANNELS

1989 ◽  
Vol 50 (C1) ◽  
pp. C1-119-C1-125 ◽  
Author(s):  
S. BOUGOUFFA ◽  
X. C. CAO
Keyword(s):  
Transition Matrix ◽  
Coupled Channels

Automation of selected brazes' dynamic properties in high-temperatures' measurement process

2013 ◽  
Vol 18 (2-3) ◽  
pp. 33-41
Author(s):  
Dominik Sankowski ◽  
Marcin Bakala ◽  
Rafał Wojciechowski
Keyword(s):  
Surface Tension ◽  
High Temperatures ◽  
Dynamic Properties ◽  
Automatic Measurement ◽  
Measurement Methodology ◽  
Joining Process ◽  
Wetting Force ◽  
Research Grant

Abstract The good quality of several manufactured components frequently depends on solidliquid interactions existing during processing. Nowadays, the research in material engineering focuses also on modern, automatic measurement methods of joining process properties, i.a. wetting force and surface tension, which allows for quantitative determination of above mentioned parameters. In the paper, the brazes’ dynamic properties in high-temperatures’ measurement methodology and the stand for automatic determination of braze’s properties, constructed and implmented within the research grant nr KBN N N519 441 839 - An integrated platform for automatic measurement of wettability and surface tension of solders at high temperatures, are widely described

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