Crystal orientation dependence of the electro-optic effect in epitaxial lanthanum-modified lead zirconate titanate films

2005 ◽  
Vol 87 (25) ◽  
pp. 251927 ◽  
Author(s):  
Keisuke Sato ◽  
Masatoshi Ishii ◽  
Kazuaki Kurihara ◽  
Masao Kondo
Keyword(s):  
Lead Zirconate Titanate ◽  
Crystal Orientation ◽  
Lead Zirconate ◽  
Orientation Dependence ◽  
Zirconate Titanate ◽  
Electro Optic

Crystal Phase and Orientation Dependence of Electro-Optic Effect in Epitaxial PLZT an PZT Films

2007 ◽  
Vol 350 ◽  
pp. 99-102
Author(s):  
Keisuke Satoh ◽  
Akio Sugama ◽  
Masatoshi Ishii ◽  
Masao Kondo ◽  
Kazuaki Kurihara
Keyword(s):  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Epitaxial Films ◽  
Orientation Dependence ◽  
Pockels Effect ◽  
Solution Deposition ◽  
Zirconate Titanate ◽  
Electro Optic ◽  
Pzt Films ◽  
Extraordinary Refractive Index

Lanthanum-modified lead zirconate titanate and lead zirconate titanate epitaxial films with (100) and (111) orientations were grown respectively on (100) and (111) niobium, lending conductivity to strontium titanate through chemical solution deposition. This study investigated changes in the ordinary and extraordinary refractive index no and ne induced in these films by an electric field using the prism-coupling method. In the (100) epitaxial PZT 30/70 film, anisotropic electro-optic effects arise from the Pockels effect. The isotropic electro-optic effect, which is no = ne , was achieved on (100) epitaxial PLZT 8/65/35 and PZT 70/30 films.

Optoenergy storage, stimulated processes in optical amplification with electro-optic ceramic gain media of Nd3+ doped lanthanum lead zirconate titanate

2011 ◽  
Vol 110 (3) ◽  
pp. 033106 ◽  
Author(s):  
Ye Wu ◽  
Hua Zhao ◽  
Yingyin K. Zou ◽  
Xuesheng Chen ◽  
Baldassare Di Bartolo ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Optical Amplification ◽  
Zirconate Titanate ◽  
Electro Optic ◽  
Gain Media

Orientation Dependence of Strontium-doped Lead Zirconate Titanate (PSZT) Thin Films on RF Magnetron Sputtering Conditions

2006 ◽  
Vol 928 ◽  
Author(s):  
Sharath Sriram ◽  
Madhu Bhaskaran ◽  
Anthony Stephen Holland ◽  
Geoffrey K Reeves
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Cooling Rate ◽  
Lead Zirconate Titanate ◽  
Ferroelectric Properties ◽  
Rf Magnetron Sputtering ◽  
Lead Zirconate ◽  
Orientation Dependence ◽  
Grain Structure ◽  
Zirconate Titanate

ABSTRACTStudies on strontium-doped lead zirconate titanate (PSZT) have been reported for its high piezoelectric and ferroelectric properties. For PSZT to exhibit pronounced piezoelectric behaviour it must have a crystalline grain structure (perovskite orientation). This paper is a study of the deposition of PSZT thin films by RF magnetron sputtering and the effect of cooling rate, after deposition at temperatures between 500 °C and 700 °C. X-Ray Diffraction (XRD) results are used to show how a cooling rate of 5 °C/min increases the degree of perovskite orientation in sputtered films, when compared to a cooling rate of 15 °C/min. The absence of significant shifts in the positions of diffraction peak patterns in XRD results are used to demonstrate low stress in the deposited films. Atomic Force Microscope (AFM) imaging is used to show the crystalline nature of the PSZT thin films.

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