Quantum well behavior of single stacking fault 3C inclusions in 4H-SiC p-i-n diodes studied by ballistic electron emission microscopy

2005 ◽  
Vol 87 (23) ◽  
pp. 232103 ◽  
Author(s):  
K.-B. Park ◽  
J. P. Pelz ◽  
J. Grim ◽  
M. Skowronski
Keyword(s):  
Quantum Well ◽  
Electron Emission ◽  
Stacking Fault ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Observation of misfit dislocations at the InxGa1−xAs/GaAs interface by ballistic‐electron‐emission microscopy

1996 ◽  
Vol 69 (7) ◽  
pp. 940-942 ◽  
Author(s):  
E. Y. Lee ◽  
S. Bhargava ◽  
M. A. Chin ◽  
V. Narayanamurti ◽  
K. J. Pond ◽  
...  
Keyword(s):  
Electron Emission ◽  
Misfit Dislocations ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy

1995 ◽  
Vol 51 (4) ◽  
pp. 2357-2362 ◽  
Author(s):  
R. Coratger ◽  
F. Ajustron ◽  
J. Beauvillain ◽  
I. M. Dharmadasa ◽  
C. J. Blomfield ◽  
...  
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Ballistic-electron-emission microscopy of strain nonuniformities inSi1−xGex/Si structures

1995 ◽  
Vol 52 (16) ◽  
pp. 12081-12089 ◽  
Author(s):  
L. D. Bell ◽  
W. J. Kaiser ◽  
S. J. Manion ◽  
A. M. Milliken ◽  
R. W. Fathauer ◽  
...  
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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